Scattering loss in thin, shallow-ridge silion-on-insulator waveguides

Thach G. Nguyen, Ravi S. Tummidi, Robert Pafchek, Thomas L Koch, Arnan Mitchell

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Roughness induced scattering in thin, shallow-ridge silicon on insulator waveguides is analyzed by coupled mode theory and verified experimentally. Roughness in different waveguide regions causes different scattering natures of TM and TE modes.

Original languageEnglish (US)
Title of host publicationCLEO: Applications and Technology, CLEO_AT 2012
StatePublished - 2012
Externally publishedYes
EventCLEO: Applications and Technology, CLEO_AT 2012 - San Jose, CA, United States
Duration: May 6 2012May 11 2012

Other

OtherCLEO: Applications and Technology, CLEO_AT 2012
CountryUnited States
CitySan Jose, CA
Period5/6/125/11/12

Fingerprint

Waveguides
Surface roughness
Scattering
Silicon

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Nguyen, T. G., Tummidi, R. S., Pafchek, R., Koch, T. L., & Mitchell, A. (2012). Scattering loss in thin, shallow-ridge silion-on-insulator waveguides. In CLEO: Applications and Technology, CLEO_AT 2012

Scattering loss in thin, shallow-ridge silion-on-insulator waveguides. / Nguyen, Thach G.; Tummidi, Ravi S.; Pafchek, Robert; Koch, Thomas L; Mitchell, Arnan.

CLEO: Applications and Technology, CLEO_AT 2012. 2012.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nguyen, TG, Tummidi, RS, Pafchek, R, Koch, TL & Mitchell, A 2012, Scattering loss in thin, shallow-ridge silion-on-insulator waveguides. in CLEO: Applications and Technology, CLEO_AT 2012. CLEO: Applications and Technology, CLEO_AT 2012, San Jose, CA, United States, 5/6/12.
Nguyen TG, Tummidi RS, Pafchek R, Koch TL, Mitchell A. Scattering loss in thin, shallow-ridge silion-on-insulator waveguides. In CLEO: Applications and Technology, CLEO_AT 2012. 2012
Nguyen, Thach G. ; Tummidi, Ravi S. ; Pafchek, Robert ; Koch, Thomas L ; Mitchell, Arnan. / Scattering loss in thin, shallow-ridge silion-on-insulator waveguides. CLEO: Applications and Technology, CLEO_AT 2012. 2012.
@inproceedings{6b66ee42f1a445db9a67bb0e7938ad20,
title = "Scattering loss in thin, shallow-ridge silion-on-insulator waveguides",
abstract = "Roughness induced scattering in thin, shallow-ridge silicon on insulator waveguides is analyzed by coupled mode theory and verified experimentally. Roughness in different waveguide regions causes different scattering natures of TM and TE modes.",
author = "Nguyen, {Thach G.} and Tummidi, {Ravi S.} and Robert Pafchek and Koch, {Thomas L} and Arnan Mitchell",
year = "2012",
language = "English (US)",
isbn = "9781557529435",
booktitle = "CLEO: Applications and Technology, CLEO_AT 2012",

}

TY - GEN

T1 - Scattering loss in thin, shallow-ridge silion-on-insulator waveguides

AU - Nguyen, Thach G.

AU - Tummidi, Ravi S.

AU - Pafchek, Robert

AU - Koch, Thomas L

AU - Mitchell, Arnan

PY - 2012

Y1 - 2012

N2 - Roughness induced scattering in thin, shallow-ridge silicon on insulator waveguides is analyzed by coupled mode theory and verified experimentally. Roughness in different waveguide regions causes different scattering natures of TM and TE modes.

AB - Roughness induced scattering in thin, shallow-ridge silicon on insulator waveguides is analyzed by coupled mode theory and verified experimentally. Roughness in different waveguide regions causes different scattering natures of TM and TE modes.

UR - http://www.scopus.com/inward/record.url?scp=84890732049&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84890732049&partnerID=8YFLogxK

M3 - Conference contribution

SN - 9781557529435

BT - CLEO: Applications and Technology, CLEO_AT 2012

ER -