Scattering loss in thin, shallow-ridge silion-on-insulator waveguides

Thach G. Nguyen, Ravi S. Tummidi, Robert Pafchek, Thomas L. Koch, Arnan Mitchell

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Roughness induced scattering in thin, shallow-ridge silicon on insulator waveguides is analyzed by coupled mode theory and verified experimentally. Roughness in different waveguide regions causes different scattering natures of TM and TE modes.

Original languageEnglish (US)
Title of host publicationCLEO
Subtitle of host publicationApplications and Technology, CLEO_AT 2012
PagesJW4A.81
StatePublished - Dec 1 2012
Externally publishedYes
EventCLEO: Applications and Technology, CLEO_AT 2012 - San Jose, CA, United States
Duration: May 6 2012May 11 2012

Publication series

NameCLEO: Applications and Technology, CLEO_AT 2012

Other

OtherCLEO: Applications and Technology, CLEO_AT 2012
CountryUnited States
CitySan Jose, CA
Period5/6/125/11/12

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Nguyen, T. G., Tummidi, R. S., Pafchek, R., Koch, T. L., & Mitchell, A. (2012). Scattering loss in thin, shallow-ridge silion-on-insulator waveguides. In CLEO: Applications and Technology, CLEO_AT 2012 (pp. JW4A.81). (CLEO: Applications and Technology, CLEO_AT 2012).