Scattering loss in thin, shallow-ridge silion-on-insulator waveguides

Thach G. Nguyen, Ravi S. Tummidi, Robert Pafchek, Thomas L Koch, Arnan Mitchell

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Roughness induced scattering in thin, shallow-ridge silicon on insulator waveguides is analyzed by coupled mode theory and verified experimentally. Roughness in different waveguide regions causes different scattering natures of TM and TE modes.

Original languageEnglish (US)
Title of host publicationOptics InfoBase Conference Papers
StatePublished - 2012
Externally publishedYes
EventQuantum Electronics and Laser Science Conference, QELS 2012 - San Jose, CA, United States
Duration: May 6 2012May 11 2012

Other

OtherQuantum Electronics and Laser Science Conference, QELS 2012
CountryUnited States
CitySan Jose, CA
Period5/6/125/11/12

Fingerprint

ridges
Waveguides
roughness
Surface roughness
insulators
Scattering
waveguides
scattering
coupled modes
Silicon
causes
silicon

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Nguyen, T. G., Tummidi, R. S., Pafchek, R., Koch, T. L., & Mitchell, A. (2012). Scattering loss in thin, shallow-ridge silion-on-insulator waveguides. In Optics InfoBase Conference Papers

Scattering loss in thin, shallow-ridge silion-on-insulator waveguides. / Nguyen, Thach G.; Tummidi, Ravi S.; Pafchek, Robert; Koch, Thomas L; Mitchell, Arnan.

Optics InfoBase Conference Papers. 2012.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nguyen, TG, Tummidi, RS, Pafchek, R, Koch, TL & Mitchell, A 2012, Scattering loss in thin, shallow-ridge silion-on-insulator waveguides. in Optics InfoBase Conference Papers. Quantum Electronics and Laser Science Conference, QELS 2012, San Jose, CA, United States, 5/6/12.
Nguyen TG, Tummidi RS, Pafchek R, Koch TL, Mitchell A. Scattering loss in thin, shallow-ridge silion-on-insulator waveguides. In Optics InfoBase Conference Papers. 2012
Nguyen, Thach G. ; Tummidi, Ravi S. ; Pafchek, Robert ; Koch, Thomas L ; Mitchell, Arnan. / Scattering loss in thin, shallow-ridge silion-on-insulator waveguides. Optics InfoBase Conference Papers. 2012.
@inproceedings{e766257d925348fb8584661f76babb5d,
title = "Scattering loss in thin, shallow-ridge silion-on-insulator waveguides",
abstract = "Roughness induced scattering in thin, shallow-ridge silicon on insulator waveguides is analyzed by coupled mode theory and verified experimentally. Roughness in different waveguide regions causes different scattering natures of TM and TE modes.",
author = "Nguyen, {Thach G.} and Tummidi, {Ravi S.} and Robert Pafchek and Koch, {Thomas L} and Arnan Mitchell",
year = "2012",
language = "English (US)",
isbn = "9781557529435",
booktitle = "Optics InfoBase Conference Papers",

}

TY - GEN

T1 - Scattering loss in thin, shallow-ridge silion-on-insulator waveguides

AU - Nguyen, Thach G.

AU - Tummidi, Ravi S.

AU - Pafchek, Robert

AU - Koch, Thomas L

AU - Mitchell, Arnan

PY - 2012

Y1 - 2012

N2 - Roughness induced scattering in thin, shallow-ridge silicon on insulator waveguides is analyzed by coupled mode theory and verified experimentally. Roughness in different waveguide regions causes different scattering natures of TM and TE modes.

AB - Roughness induced scattering in thin, shallow-ridge silicon on insulator waveguides is analyzed by coupled mode theory and verified experimentally. Roughness in different waveguide regions causes different scattering natures of TM and TE modes.

UR - http://www.scopus.com/inward/record.url?scp=84893480909&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84893480909&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84893480909

SN - 9781557529435

BT - Optics InfoBase Conference Papers

ER -