Scattering loss in thin, shallow-ridge silion-on-insulator waveguides

Thach G. Nguyen, Ravi S. Tummidi, Robert Pafchek, Thomas L. Koch, Arnan Mitchell

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Roughness induced scattering in thin, shallow-ridge silicon on insulator waveguides is analyzed by coupled mode theory and verified experimentally. Roughness in different waveguide regions causes different scattering natures of TM and TE modes.

Original languageEnglish (US)
Title of host publicationQuantum Electronics and Laser Science Conference, QELS 2012
StatePublished - 2012
Externally publishedYes
EventQuantum Electronics and Laser Science Conference, QELS 2012 - San Jose, CA, United States
Duration: May 6 2012May 11 2012

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherQuantum Electronics and Laser Science Conference, QELS 2012
CountryUnited States
CitySan Jose, CA
Period5/6/125/11/12

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Fingerprint Dive into the research topics of 'Scattering loss in thin, shallow-ridge silion-on-insulator waveguides'. Together they form a unique fingerprint.

  • Cite this

    Nguyen, T. G., Tummidi, R. S., Pafchek, R., Koch, T. L., & Mitchell, A. (2012). Scattering loss in thin, shallow-ridge silion-on-insulator waveguides. In Quantum Electronics and Laser Science Conference, QELS 2012 (Optics InfoBase Conference Papers).