Scattering measurements on optical disks and their relation to media noise

Xiaodong Xun, Chubing Peng, Kimihiro Saito, Masud Mansuripur

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

We have conducted measurements of scattered light from bare polycarbonate and glass substrates and from complete optical disks using a He-Ne laser beam in different polarization states and at different angles of incidence. The results are compared with the measured media noise obtained from the same disks on a dynamic tester. Both the scattered light and the media noise originate from the jaggedness and other imperfections of the groove structure, the roughness of the substrate's surface, and the inhomogeneities of the bulk of the substrate. Although some sources of media noise manifest themselves in the scattered light distribution, others cannot be easily detected by this type of measurement.

Original languageEnglish (US)
Pages (from-to)4728-4737
Number of pages10
JournalApplied Optics
Volume40
Issue number26
StatePublished - Sep 10 2001

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optical disks
Scattering
Substrates
scattering
polycarbonates
Polycarbonates
test equipment
grooves
Laser beams
inhomogeneity
roughness
incidence
Surface roughness
laser beams
Polarization
Glass
Defects
glass
defects
polarization

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Scattering measurements on optical disks and their relation to media noise. / Xun, Xiaodong; Peng, Chubing; Saito, Kimihiro; Mansuripur, Masud.

In: Applied Optics, Vol. 40, No. 26, 10.09.2001, p. 4728-4737.

Research output: Contribution to journalArticle

Xun, Xiaodong ; Peng, Chubing ; Saito, Kimihiro ; Mansuripur, Masud. / Scattering measurements on optical disks and their relation to media noise. In: Applied Optics. 2001 ; Vol. 40, No. 26. pp. 4728-4737.
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