Abstract
The Burch scatterplate interferometer is an extremely precise, equal path interferometer that provides direct wavefront information without the use of any precision optical components. This paper describes the use of Fourier transform techniques to provide a straightforward scalar diffraction theory of the interferometer. The results show the characteristic hot spot and speckle pattern seen in scatterplate interferograms. Practical applications of the theory are also discussed.
Original language | English (US) |
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Pages (from-to) | 52-57 |
Number of pages | 6 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 190 |
DOIs | |
State | Published - Nov 13 1980 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering