Scatterplate interferometry: A diffraction theory

L. A. Johnson; John Hayes

doi:10.1117/12.957722

Scatterplate interferometry: A diffraction theory

L. A. Johnson, John Hayes

Landscape Architecture, School of

Research output: Contribution to journal › Article › peer-review

Abstract

The Burch scatterplate interferometer is an extremely precise, equal path interferometer that provides direct wavefront information without the use of any precision optical components. This paper describes the use of Fourier transform techniques to provide a straightforward scalar diffraction theory of the interferometer. The results show the characteristic hot spot and speckle pattern seen in scatterplate interferograms. Practical applications of the theory are also discussed.

Original language	English (US)
Pages (from-to)	52-57
Number of pages	6
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	190
DOIs	https://doi.org/10.1117/12.957722
State	Published - Nov 13 1980

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.957722

Cite this

@article{f8443dba685c4c4a9fc14b6b554854e9,

title = "Scatterplate interferometry: A diffraction theory",

abstract = "The Burch scatterplate interferometer is an extremely precise, equal path interferometer that provides direct wavefront information without the use of any precision optical components. This paper describes the use of Fourier transform techniques to provide a straightforward scalar diffraction theory of the interferometer. The results show the characteristic hot spot and speckle pattern seen in scatterplate interferograms. Practical applications of the theory are also discussed.",

author = "Johnson, {L. A.} and John Hayes",

year = "1980",

month = nov,

day = "13",

doi = "10.1117/12.957722",

language = "English (US)",

volume = "190",

pages = "52--57",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

}

TY - JOUR

T1 - Scatterplate interferometry

T2 - A diffraction theory

AU - Johnson, L. A.

AU - Hayes, John

PY - 1980/11/13

Y1 - 1980/11/13

N2 - The Burch scatterplate interferometer is an extremely precise, equal path interferometer that provides direct wavefront information without the use of any precision optical components. This paper describes the use of Fourier transform techniques to provide a straightforward scalar diffraction theory of the interferometer. The results show the characteristic hot spot and speckle pattern seen in scatterplate interferograms. Practical applications of the theory are also discussed.

AB - The Burch scatterplate interferometer is an extremely precise, equal path interferometer that provides direct wavefront information without the use of any precision optical components. This paper describes the use of Fourier transform techniques to provide a straightforward scalar diffraction theory of the interferometer. The results show the characteristic hot spot and speckle pattern seen in scatterplate interferograms. Practical applications of the theory are also discussed.

UR - http://www.scopus.com/inward/record.url?scp=84957506584&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84957506584&partnerID=8YFLogxK

U2 - 10.1117/12.957722

DO - 10.1117/12.957722

M3 - Article

AN - SCOPUS:84957506584

VL - 190

SP - 52

EP - 57

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

ER -

Scatterplate interferometry: A diffraction theory

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this