Scatterplate interferometry: A diffraction theory

L. A. Johnson; John Hayes

doi:10.1117/12.957722

Scatterplate interferometry: A diffraction theory

L. A. Johnson, John Hayes

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Abstract

The Burch scatterplate interferometer is an extremely precise, equal path interferometer that provides direct wavefront information without the use of any precision optical components. This paper describes the use of Fourier transform techniques to provide a straightforward scalar diffraction theory of the interferometer. The results show the characteristic hot spot and speckle pattern seen in scatterplate interferograms. Practical applications of the theory are also discussed.

Original language	English (US)
Pages (from-to)	52-57
Number of pages	6
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	190
DOIs	https://doi.org/10.1117/12.957722
State	Published - Nov 13 1980

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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