Seek reliability enhancement in optical and magneto-optical disk data storage devices

N. Bui, M. K. Sundareshan, Hal S Tharp

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

In this paper, we shall propose an integrated architecture that effectively combines the use of low pass filtering techniques with a phase locked loop design to overcome degradations in the seek function resulting from the presence of defects on the recording medium. A performance evaluation study is included to demonstrate the superior performance delivered by the present scheme over a wide range of seek velocities.

Original languageEnglish (US)
Pages (from-to)3802-3804
Number of pages3
JournalIEEE Transactions on Magnetics
Volume29
Issue number6 pt 2
DOIs
StatePublished - Nov 1993

Fingerprint

optical disks
Phase locked loops
data storage
Degradation
Defects
augmentation
recording
degradation
evaluation
defects

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Physics and Astronomy (miscellaneous)

Cite this

Seek reliability enhancement in optical and magneto-optical disk data storage devices. / Bui, N.; Sundareshan, M. K.; Tharp, Hal S.

In: IEEE Transactions on Magnetics, Vol. 29, No. 6 pt 2, 11.1993, p. 3802-3804.

Research output: Contribution to journalArticle

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