Sensitivity of AsxSe100-x thin films for electron beam irradiation

N. Nordman, O. Nordman, N. Peyghambarian

Research output: Contribution to journalConference article

Original languageEnglish (US)
Pages (from-to)813-819
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3482
DOIs
StatePublished - Sep 21 1998
EventInternational Optical Design Conference 1998 - Kona, United States
Duration: Jun 8 1998Jun 12 1998

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this