Shear test of the off-axis surface with an axis-symmetric parent

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Interferometers with additional test optics are frequently used for measuring aspherical optical surfaces. In optical testing it is desirable to separate the figure measurement errors due to the test surface from figure errors that arise in the test equipment. For axially symmetric optics this is accomplished by rotating the surface being measured with respect to the test system. The data can then be processed to separate the non-axially symmetric errors that are fixed in the test system and those that rotate with the part. The axially symmetric errors cannot be distinguished with this technique. In this paper we present a variation of this technique for off-axis aspheric optics. The rotation is performed by rotating the test surface about the optical axis of its parent asphere, which may be outside the physical boundary of the test surface. As these rotations cannot be large, this motion is better described as a shear of the optical surface with respect to the test optics. By taking multiple measurements with different amounts of rotational shear and using maximum likelihood estimation methods, one can separate the errors in the test optics from the irregularity in the optical surface.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume6671
DOIs
StatePublished - 2007
EventOptical Manufacturing and Testing VII - San Diego, CA, United States
Duration: Aug 28 2007Aug 29 2007

Other

OtherOptical Manufacturing and Testing VII
CountryUnited States
CitySan Diego, CA
Period8/28/078/29/07

Fingerprint

shear
Optics
optics
aspheric optics
Optical testing
Maximum likelihood estimation
Measurement errors
Interferometers
test equipment
irregularities
interferometers

Keywords

  • Aspheres
  • Interferometry
  • Optical fabrication
  • Optical testing
  • Telescopes

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Su, P., Burge, J. H., & Sasian, J. M. (2007). Shear test of the off-axis surface with an axis-symmetric parent. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 6671). [66710R] https://doi.org/10.1117/12.731971

Shear test of the off-axis surface with an axis-symmetric parent. / Su, Peng; Burge, James H; Sasian, Jose M.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6671 2007. 66710R.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Su, P, Burge, JH & Sasian, JM 2007, Shear test of the off-axis surface with an axis-symmetric parent. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 6671, 66710R, Optical Manufacturing and Testing VII, San Diego, CA, United States, 8/28/07. https://doi.org/10.1117/12.731971
Su P, Burge JH, Sasian JM. Shear test of the off-axis surface with an axis-symmetric parent. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6671. 2007. 66710R https://doi.org/10.1117/12.731971
Su, Peng ; Burge, James H ; Sasian, Jose M. / Shear test of the off-axis surface with an axis-symmetric parent. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6671 2007.
@inproceedings{1e798846c6cd4ec8ac7f359ed651deee,
title = "Shear test of the off-axis surface with an axis-symmetric parent",
abstract = "Interferometers with additional test optics are frequently used for measuring aspherical optical surfaces. In optical testing it is desirable to separate the figure measurement errors due to the test surface from figure errors that arise in the test equipment. For axially symmetric optics this is accomplished by rotating the surface being measured with respect to the test system. The data can then be processed to separate the non-axially symmetric errors that are fixed in the test system and those that rotate with the part. The axially symmetric errors cannot be distinguished with this technique. In this paper we present a variation of this technique for off-axis aspheric optics. The rotation is performed by rotating the test surface about the optical axis of its parent asphere, which may be outside the physical boundary of the test surface. As these rotations cannot be large, this motion is better described as a shear of the optical surface with respect to the test optics. By taking multiple measurements with different amounts of rotational shear and using maximum likelihood estimation methods, one can separate the errors in the test optics from the irregularity in the optical surface.",
keywords = "Aspheres, Interferometry, Optical fabrication, Optical testing, Telescopes",
author = "Peng Su and Burge, {James H} and Sasian, {Jose M}",
year = "2007",
doi = "10.1117/12.731971",
language = "English (US)",
isbn = "9780819468192",
volume = "6671",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

}

TY - GEN

T1 - Shear test of the off-axis surface with an axis-symmetric parent

AU - Su, Peng

AU - Burge, James H

AU - Sasian, Jose M

PY - 2007

Y1 - 2007

N2 - Interferometers with additional test optics are frequently used for measuring aspherical optical surfaces. In optical testing it is desirable to separate the figure measurement errors due to the test surface from figure errors that arise in the test equipment. For axially symmetric optics this is accomplished by rotating the surface being measured with respect to the test system. The data can then be processed to separate the non-axially symmetric errors that are fixed in the test system and those that rotate with the part. The axially symmetric errors cannot be distinguished with this technique. In this paper we present a variation of this technique for off-axis aspheric optics. The rotation is performed by rotating the test surface about the optical axis of its parent asphere, which may be outside the physical boundary of the test surface. As these rotations cannot be large, this motion is better described as a shear of the optical surface with respect to the test optics. By taking multiple measurements with different amounts of rotational shear and using maximum likelihood estimation methods, one can separate the errors in the test optics from the irregularity in the optical surface.

AB - Interferometers with additional test optics are frequently used for measuring aspherical optical surfaces. In optical testing it is desirable to separate the figure measurement errors due to the test surface from figure errors that arise in the test equipment. For axially symmetric optics this is accomplished by rotating the surface being measured with respect to the test system. The data can then be processed to separate the non-axially symmetric errors that are fixed in the test system and those that rotate with the part. The axially symmetric errors cannot be distinguished with this technique. In this paper we present a variation of this technique for off-axis aspheric optics. The rotation is performed by rotating the test surface about the optical axis of its parent asphere, which may be outside the physical boundary of the test surface. As these rotations cannot be large, this motion is better described as a shear of the optical surface with respect to the test optics. By taking multiple measurements with different amounts of rotational shear and using maximum likelihood estimation methods, one can separate the errors in the test optics from the irregularity in the optical surface.

KW - Aspheres

KW - Interferometry

KW - Optical fabrication

KW - Optical testing

KW - Telescopes

UR - http://www.scopus.com/inward/record.url?scp=42149113025&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=42149113025&partnerID=8YFLogxK

U2 - 10.1117/12.731971

DO - 10.1117/12.731971

M3 - Conference contribution

AN - SCOPUS:42149113025

SN - 9780819468192

VL - 6671

BT - Proceedings of SPIE - The International Society for Optical Engineering

ER -