Short wavelength and polarized phase shifting fringe projection imaging of translucent objects

Research output: Contribution to journalArticle

10 Scopus citations

Abstract

Measuring surface topography of translucent objects with phase shifting fringe projection method is a challenge because of the reduced fringe contrast due to the scattering inside the object. The internal structure also has an impact to the measurement. We present a new phase shifting fringe project imaging method to measure three-dimensional surface shapes of translucent objects. This method employs polarized short wavelength to increase the fringe contrast by reducing the internal scattered light from reaching the camera.

Original languageEnglish (US)
Article number014104
JournalOptical Engineering
Volume53
Issue number1
DOIs
StatePublished - Jan 2014

Keywords

  • fringe projection
  • phase shifting
  • three-dimensional surface measurement
  • translucent object

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering(all)

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