Abstract
Bit-wise three-dimensional data storage techniques are attractive candidates to increase capacity. Two major bit-wise volumetric data storage techniques have been proposed. The first one is based on a two-photon fluorescent material. The second one is based on materials that change their refractive index. Simulations based on 3D optical transfer functions are described that predict the signal, cross talk and signal to noise ratio of different bit-wise volumetric read out systems. Experimental results based on a fluorescent material are presented.
| Original language | English (US) |
|---|---|
| Title of host publication | 2002 International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002, Technical Digest |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 246-248 |
| Number of pages | 3 |
| ISBN (Print) | 0780373790, 9780780373792 |
| DOIs | |
| State | Published - 2002 |
| Event | International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002 - Waikoloa, United States Duration: Jul 7 2002 → Jul 11 2002 |
Other
| Other | International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002 |
|---|---|
| Country | United States |
| City | Waikoloa |
| Period | 7/7/02 → 7/11/02 |
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ASJC Scopus subject areas
- Hardware and Architecture
- Electronic, Optical and Magnetic Materials
Cite this
Signal, cross talk and signal to noise ratio in bit-wise volumetric optical data storage. / Zhang, Yan; Milster, Thomas D; Butz, J.; Bletcher, W.; Erwin, K. J.; Walker, E.
2002 International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002, Technical Digest. Institute of Electrical and Electronics Engineers Inc., 2002. p. 246-248 1028630.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Signal, cross talk and signal to noise ratio in bit-wise volumetric optical data storage
AU - Zhang, Yan
AU - Milster, Thomas D
AU - Butz, J.
AU - Bletcher, W.
AU - Erwin, K. J.
AU - Walker, E.
PY - 2002
Y1 - 2002
N2 - Bit-wise three-dimensional data storage techniques are attractive candidates to increase capacity. Two major bit-wise volumetric data storage techniques have been proposed. The first one is based on a two-photon fluorescent material. The second one is based on materials that change their refractive index. Simulations based on 3D optical transfer functions are described that predict the signal, cross talk and signal to noise ratio of different bit-wise volumetric read out systems. Experimental results based on a fluorescent material are presented.
AB - Bit-wise three-dimensional data storage techniques are attractive candidates to increase capacity. Two major bit-wise volumetric data storage techniques have been proposed. The first one is based on a two-photon fluorescent material. The second one is based on materials that change their refractive index. Simulations based on 3D optical transfer functions are described that predict the signal, cross talk and signal to noise ratio of different bit-wise volumetric read out systems. Experimental results based on a fluorescent material are presented.
UR - http://www.scopus.com/inward/record.url?scp=84962788718&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84962788718&partnerID=8YFLogxK
U2 - 10.1109/OMODS.2002.1028630
DO - 10.1109/OMODS.2002.1028630
M3 - Conference contribution
SN - 0780373790
SN - 9780780373792
SP - 246
EP - 248
BT - 2002 International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002, Technical Digest
PB - Institute of Electrical and Electronics Engineers Inc.
ER -