Silicon detector system for high rate EXAFS applications

A. Pullia; H. W. Kraner; D. P. Siddons; L. R. Furenlid; G. Bertuccio

Silicon detector system for high rate EXAFS applications

A. Pullia, H. W. Kraner, D. P. Siddons, L. R. Furenlid, G. Bertuccio

Research output: Contribution to conference › Paper › peer-review

Abstract

A multichannel silicon pad detector for EXAFS (Extended X-ray Absorption Fine Structure) applications has been designed and built. The X-ray spectroscopic measurements demonstrate that an adequate energy resolution of 230 eV FWHM (corresponding to 27 rms electrons in silicon) can be achieved reliably at -35°C. A resolution of 190 eV FWHM (corresponding to 22 rms electrons) has been obtained from individual pads at -35°C. At room temperature (25°C) an average energy resolution of 380 eV FWHM is achieved and a resolution of 350 eV FWHM (41 rms electrons) is the best performance. A simple cooling system constituted of Peltier cells is sufficient to reduce the reverse currents of the pads and their related shot noise contribution, in order to achieve resolutions better than 300 eV FWHM which is adequate for the EXAFS applications.

Original language	English (US)
Pages	463-467
Number of pages	5
State	Published - 1995
Externally published	Yes
Event	Proceedings of the 1994 Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 4) - Norfolk, VA, USA Duration: Oct 30 1994 → Nov 5 1994

Other

Other	Proceedings of the 1994 Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 4)
City	Norfolk, VA, USA
Period	10/30/94 → 11/5/94

ASJC Scopus subject areas

Radiation
Nuclear and High Energy Physics
Radiology Nuclear Medicine and imaging

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Cite this

@conference{9df2279da400448fab664f6bd599717b,

title = "Silicon detector system for high rate EXAFS applications",

abstract = "A multichannel silicon pad detector for EXAFS (Extended X-ray Absorption Fine Structure) applications has been designed and built. The X-ray spectroscopic measurements demonstrate that an adequate energy resolution of 230 eV FWHM (corresponding to 27 rms electrons in silicon) can be achieved reliably at -35°C. A resolution of 190 eV FWHM (corresponding to 22 rms electrons) has been obtained from individual pads at -35°C. At room temperature (25°C) an average energy resolution of 380 eV FWHM is achieved and a resolution of 350 eV FWHM (41 rms electrons) is the best performance. A simple cooling system constituted of Peltier cells is sufficient to reduce the reverse currents of the pads and their related shot noise contribution, in order to achieve resolutions better than 300 eV FWHM which is adequate for the EXAFS applications.",

author = "A. Pullia and Kraner, {H. W.} and Siddons, {D. P.} and Furenlid, {L. R.} and G. Bertuccio",

note = "Copyright: Copyright 2004 Elsevier B.V., All rights reserved.; Proceedings of the 1994 Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 4) ; Conference date: 30-10-1994 Through 05-11-1994",

year = "1995",

language = "English (US)",

pages = "463--467",

}

TY - CONF

T1 - Silicon detector system for high rate EXAFS applications

AU - Pullia, A.

AU - Kraner, H. W.

AU - Siddons, D. P.

AU - Furenlid, L. R.

AU - Bertuccio, G.

PY - 1995

Y1 - 1995

N2 - A multichannel silicon pad detector for EXAFS (Extended X-ray Absorption Fine Structure) applications has been designed and built. The X-ray spectroscopic measurements demonstrate that an adequate energy resolution of 230 eV FWHM (corresponding to 27 rms electrons in silicon) can be achieved reliably at -35°C. A resolution of 190 eV FWHM (corresponding to 22 rms electrons) has been obtained from individual pads at -35°C. At room temperature (25°C) an average energy resolution of 380 eV FWHM is achieved and a resolution of 350 eV FWHM (41 rms electrons) is the best performance. A simple cooling system constituted of Peltier cells is sufficient to reduce the reverse currents of the pads and their related shot noise contribution, in order to achieve resolutions better than 300 eV FWHM which is adequate for the EXAFS applications.

AB - A multichannel silicon pad detector for EXAFS (Extended X-ray Absorption Fine Structure) applications has been designed and built. The X-ray spectroscopic measurements demonstrate that an adequate energy resolution of 230 eV FWHM (corresponding to 27 rms electrons in silicon) can be achieved reliably at -35°C. A resolution of 190 eV FWHM (corresponding to 22 rms electrons) has been obtained from individual pads at -35°C. At room temperature (25°C) an average energy resolution of 380 eV FWHM is achieved and a resolution of 350 eV FWHM (41 rms electrons) is the best performance. A simple cooling system constituted of Peltier cells is sufficient to reduce the reverse currents of the pads and their related shot noise contribution, in order to achieve resolutions better than 300 eV FWHM which is adequate for the EXAFS applications.

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M3 - Paper

AN - SCOPUS:0029238379

SP - 463

EP - 467

T2 - Proceedings of the 1994 Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 4)

Y2 - 30 October 1994 through 5 November 1994

ER -