Silicon detector system for high rate EXAFS applications

A. Pullia, H. W. Kraner, D. P. Siddons, L. R. Furenlid, G. Bertuccio

Research output: Contribution to conferencePaper

1 Scopus citations

Abstract

A multichannel silicon pad detector for EXAFS (Extended X-ray Absorption Fine Structure) applications has been designed and built. The X-ray spectroscopic measurements demonstrate that an adequate energy resolution of 230 eV FWHM (corresponding to 27 rms electrons in silicon) can be achieved reliably at -35°C. A resolution of 190 eV FWHM (corresponding to 22 rms electrons) has been obtained from individual pads at -35°C. At room temperature (25°C) an average energy resolution of 380 eV FWHM is achieved and a resolution of 350 eV FWHM (41 rms electrons) is the best performance. A simple cooling system constituted of Peltier cells is sufficient to reduce the reverse currents of the pads and their related shot noise contribution, in order to achieve resolutions better than 300 eV FWHM which is adequate for the EXAFS applications.

Original languageEnglish (US)
Pages463-467
Number of pages5
StatePublished - Jan 1 1995
Externally publishedYes
EventProceedings of the 1994 Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 4) - Norfolk, VA, USA
Duration: Oct 30 1994Nov 5 1994

Other

OtherProceedings of the 1994 Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 4)
CityNorfolk, VA, USA
Period10/30/9411/5/94

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Industrial and Manufacturing Engineering

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    Pullia, A., Kraner, H. W., Siddons, D. P., Furenlid, L. R., & Bertuccio, G. (1995). Silicon detector system for high rate EXAFS applications. 463-467. Paper presented at Proceedings of the 1994 Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 4), Norfolk, VA, USA, .