Silicon detector system for high rate EXAFS applications

A. Pullia; H. W. Kraner; D. P. Siddons; L. R. Furenlid; G. Bertuccio

Silicon detector system for high rate EXAFS applications

A. Pullia, H. W. Kraner, D. P. Siddons, L. R. Furenlid, G. Bertuccio

Research output: Contribution to conference › Paper

Abstract

A multichannel silicon pad detector for EXAFS (Extended X-ray Absorption Fine Structure) applications has been designed and built. The X-ray spectroscopic measurements demonstrate that an adequate energy resolution of 230 eV FWHM (corresponding to 27 rms electrons in silicon) can be achieved reliably at -35°C. A resolution of 190 eV FWHM (corresponding to 22 rms electrons) has been obtained from individual pads at -35°C. At room temperature (25°C) an average energy resolution of 380 eV FWHM is achieved and a resolution of 350 eV FWHM (41 rms electrons) is the best performance. A simple cooling system constituted of Peltier cells is sufficient to reduce the reverse currents of the pads and their related shot noise contribution, in order to achieve resolutions better than 300 eV FWHM which is adequate for the EXAFS applications.

Original language	English (US)
Pages	463-467
Number of pages	5
State	Published - Jan 1 1995
Externally published	Yes
Event	Proceedings of the 1994 Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 4) - Norfolk, VA, USA Duration: Oct 30 1994 → Nov 5 1994

Other

Other	Proceedings of the 1994 Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 4)
City	Norfolk, VA, USA
Period	10/30/94 → 11/5/94

ASJC Scopus subject areas

Computer Vision and Pattern Recognition
Industrial and Manufacturing Engineering

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Pullia, A., Kraner, H. W., Siddons, D. P., Furenlid, L. R., & Bertuccio, G. (1995). Silicon detector system for high rate EXAFS applications. 463-467. Paper presented at Proceedings of the 1994 Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 4), Norfolk, VA, USA, .

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title = "Silicon detector system for high rate EXAFS applications",

abstract = "A multichannel silicon pad detector for EXAFS (Extended X-ray Absorption Fine Structure) applications has been designed and built. The X-ray spectroscopic measurements demonstrate that an adequate energy resolution of 230 eV FWHM (corresponding to 27 rms electrons in silicon) can be achieved reliably at -35°C. A resolution of 190 eV FWHM (corresponding to 22 rms electrons) has been obtained from individual pads at -35°C. At room temperature (25°C) an average energy resolution of 380 eV FWHM is achieved and a resolution of 350 eV FWHM (41 rms electrons) is the best performance. A simple cooling system constituted of Peltier cells is sufficient to reduce the reverse currents of the pads and their related shot noise contribution, in order to achieve resolutions better than 300 eV FWHM which is adequate for the EXAFS applications.",

author = "A. Pullia and Kraner, {H. W.} and Siddons, {D. P.} and Furenlid, {L. R.} and G. Bertuccio",

year = "1995",

month = jan,

day = "1",

language = "English (US)",

pages = "463--467",

note = "Proceedings of the 1994 Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 4) ; Conference date: 30-10-1994 Through 05-11-1994",

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T1 - Silicon detector system for high rate EXAFS applications

AU - Pullia, A.

AU - Kraner, H. W.

AU - Siddons, D. P.

AU - Furenlid, L. R.

AU - Bertuccio, G.

PY - 1995/1/1

Y1 - 1995/1/1

N2 - A multichannel silicon pad detector for EXAFS (Extended X-ray Absorption Fine Structure) applications has been designed and built. The X-ray spectroscopic measurements demonstrate that an adequate energy resolution of 230 eV FWHM (corresponding to 27 rms electrons in silicon) can be achieved reliably at -35°C. A resolution of 190 eV FWHM (corresponding to 22 rms electrons) has been obtained from individual pads at -35°C. At room temperature (25°C) an average energy resolution of 380 eV FWHM is achieved and a resolution of 350 eV FWHM (41 rms electrons) is the best performance. A simple cooling system constituted of Peltier cells is sufficient to reduce the reverse currents of the pads and their related shot noise contribution, in order to achieve resolutions better than 300 eV FWHM which is adequate for the EXAFS applications.

AB - A multichannel silicon pad detector for EXAFS (Extended X-ray Absorption Fine Structure) applications has been designed and built. The X-ray spectroscopic measurements demonstrate that an adequate energy resolution of 230 eV FWHM (corresponding to 27 rms electrons in silicon) can be achieved reliably at -35°C. A resolution of 190 eV FWHM (corresponding to 22 rms electrons) has been obtained from individual pads at -35°C. At room temperature (25°C) an average energy resolution of 380 eV FWHM is achieved and a resolution of 350 eV FWHM (41 rms electrons) is the best performance. A simple cooling system constituted of Peltier cells is sufficient to reduce the reverse currents of the pads and their related shot noise contribution, in order to achieve resolutions better than 300 eV FWHM which is adequate for the EXAFS applications.

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