Simultaneous angular alignment of segmented mirrors using sinusoidal pattern analysis

Heejoo Choi, Isaac Trumper, Matthew B Dubin, Wenchuan Zhao, Dae Wook Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A segmented mirror is one of the most promising solutions to build an extremely large aperture telescope to reveal the secrets of the universe. In this manuscript, we present a simultaneous angle alignment method for segmented mirrors. By taking the displayed sinusoidal pattern reflecting off the mirrors, the tip-tilt angles are measured with 0.8 μrad resolution for a flat mirror. Due to the efficient calculation using Fourier analysis, the total measurement time for seven flat mirrors is 0.07 s. In addition, a multiplexed sinusoidal pattern is adapted to resolve the intrinsic 2π ambiguity problem in a sinusoidal signal. The presented method can measure any number of segmented mirrors provided that the camera's field of view can cover them all simultaneously.

Original languageEnglish (US)
Title of host publicationOptical System Alignment, Tolerancing, and Verification XI
PublisherSPIE
Volume10377
ISBN (Electronic)9781510612112
DOIs
Publication statusPublished - Jan 1 2017
EventOptical System Alignment, Tolerancing, and Verification XI 2017 - San Diego, United States
Duration: Aug 6 2017Aug 7 2017

Other

OtherOptical System Alignment, Tolerancing, and Verification XI 2017
CountryUnited States
CitySan Diego
Period8/6/178/7/17

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Keywords

  • Alignment
  • Angle measurement
  • Deflectometry
  • Fourier analysis
  • Metrology instrumentation
  • Multi-segmented mirror

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Choi, H., Trumper, I., Dubin, M. B., Zhao, W., & Kim, D. W. (2017). Simultaneous angular alignment of segmented mirrors using sinusoidal pattern analysis. In Optical System Alignment, Tolerancing, and Verification XI (Vol. 10377). [103770G] SPIE. https://doi.org/10.1117/12.2275197