Situation assessment and decision making integrated into the process centered environment

S. White, S. Dorchak, J. Keane, W. Pallack, J. Owens, Jerzy W Rozenblit, J. Davis, J. Sztipanovits

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Researchers have defined a number of process modeling methods and have developed in-roads to process centered environments that support process modeling and project control. However, there is little research that incorporates variability of the human condition into process modeling. The negative effects of numerous variables on the quality of human situation assessment and decision making can be as detrimental to expected results as any catastrophic failure. The research documented in the paper proposes a model for situation assessment, and derives a taxonomy of individual, task, environmental, and organizational attributes that can affect situation assessment and decision making. The model and attributes are integrated with a state based process modeling paradigm. The MultiGraph Architecture, Vanderbilt University's model integrated computing environment, was used quickly and cost effectively to generate a graphical process modeling environment that accounts for situation assessment and decision making.

Original languageEnglish (US)
Title of host publicationProceedings - ECBS 1999, IEEE Conference and Workshop on Engineering of Computer-Based Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages129-135
Number of pages7
ISBN (Electronic)0769500285, 9780769500287
DOIs
StatePublished - Jan 1 1999
Event1999 IEEE Conference and Workshop on Engineering of Computer-Based Systems, ECBS 1999 - Nashville, United States
Duration: Mar 7 1999Mar 12 1999

Other

Other1999 IEEE Conference and Workshop on Engineering of Computer-Based Systems, ECBS 1999
CountryUnited States
CityNashville
Period3/7/993/12/99

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ASJC Scopus subject areas

  • Hardware and Architecture

Cite this

White, S., Dorchak, S., Keane, J., Pallack, W., Owens, J., Rozenblit, J. W., ... Sztipanovits, J. (1999). Situation assessment and decision making integrated into the process centered environment. In Proceedings - ECBS 1999, IEEE Conference and Workshop on Engineering of Computer-Based Systems (pp. 129-135). [755871] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ECBS.1999.755871

Situation assessment and decision making integrated into the process centered environment. / White, S.; Dorchak, S.; Keane, J.; Pallack, W.; Owens, J.; Rozenblit, Jerzy W; Davis, J.; Sztipanovits, J.

Proceedings - ECBS 1999, IEEE Conference and Workshop on Engineering of Computer-Based Systems. Institute of Electrical and Electronics Engineers Inc., 1999. p. 129-135 755871.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

White, S, Dorchak, S, Keane, J, Pallack, W, Owens, J, Rozenblit, JW, Davis, J & Sztipanovits, J 1999, Situation assessment and decision making integrated into the process centered environment. in Proceedings - ECBS 1999, IEEE Conference and Workshop on Engineering of Computer-Based Systems., 755871, Institute of Electrical and Electronics Engineers Inc., pp. 129-135, 1999 IEEE Conference and Workshop on Engineering of Computer-Based Systems, ECBS 1999, Nashville, United States, 3/7/99. https://doi.org/10.1109/ECBS.1999.755871
White S, Dorchak S, Keane J, Pallack W, Owens J, Rozenblit JW et al. Situation assessment and decision making integrated into the process centered environment. In Proceedings - ECBS 1999, IEEE Conference and Workshop on Engineering of Computer-Based Systems. Institute of Electrical and Electronics Engineers Inc. 1999. p. 129-135. 755871 https://doi.org/10.1109/ECBS.1999.755871
White, S. ; Dorchak, S. ; Keane, J. ; Pallack, W. ; Owens, J. ; Rozenblit, Jerzy W ; Davis, J. ; Sztipanovits, J. / Situation assessment and decision making integrated into the process centered environment. Proceedings - ECBS 1999, IEEE Conference and Workshop on Engineering of Computer-Based Systems. Institute of Electrical and Electronics Engineers Inc., 1999. pp. 129-135
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