Size-dependent analysis of the metal-insulator transition in the integral quantum hall effect

Stephan W Koch, R. J. Haug, K. V. Klitzing, K. Ploog

Research output: Contribution to journalArticle

227 Citations (Scopus)

Abstract

The critical exponent of the localization length in the integral quantum Hall regime can be measured directly using the Hall-bar geometries with different sizes. We obtain a universal behavior for the three lowest Landau levels. This is in agreement with the universality prediction of the field-theoretic approach to the metal-insulator transition in the quantum Hall effect. The value of =2.30.1 agrees with recent numerical studies for the lowest Landau level. The measured value of the temperature exponent of the inelastic-scattering rate is found to range from p=2.70.3 to p=3.40.4.

Original languageEnglish (US)
Pages (from-to)883-886
Number of pages4
JournalPhysical Review Letters
Volume67
Issue number7
DOIs
StatePublished - 1991
Externally publishedYes

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quantum Hall effect
insulators
exponents
metals
inelastic scattering
geometry
predictions
temperature

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Size-dependent analysis of the metal-insulator transition in the integral quantum hall effect. / Koch, Stephan W; Haug, R. J.; Klitzing, K. V.; Ploog, K.

In: Physical Review Letters, Vol. 67, No. 7, 1991, p. 883-886.

Research output: Contribution to journalArticle

Koch, Stephan W ; Haug, R. J. ; Klitzing, K. V. ; Ploog, K. / Size-dependent analysis of the metal-insulator transition in the integral quantum hall effect. In: Physical Review Letters. 1991 ; Vol. 67, No. 7. pp. 883-886.
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