Slope measuring metrology for precision free-form surfaces

R. E. Parks, P. Su, T. Zobrist, T. Su, W. H. Park, M. Dominguez, L. Wang, G. Zhu, G. Butel, S. H. Lu, Y. Wang, P. Zhou, J. H. Burge

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationProceedings - ASPE 2011 Spring Topical Meeting
Subtitle of host publicationStructured and Freeform Surfaces
Pages43-48
Number of pages6
StatePublished - Dec 1 2011
EventASPE 2011 Spring Topical Meeting on Structured and Freeform Surfaces - Charlotte, NC, United States
Duration: Mar 6 2011Mar 8 2011

Publication series

NameProceedings - ASPE 2011 Spring Topical Meeting: Structured and Freeform Surfaces
Volume51

Other

OtherASPE 2011 Spring Topical Meeting on Structured and Freeform Surfaces
CountryUnited States
CityCharlotte, NC
Period3/6/113/8/11

ASJC Scopus subject areas

  • Engineering (miscellaneous)

Cite this

Parks, R. E., Su, P., Zobrist, T., Su, T., Park, W. H., Dominguez, M., Wang, L., Zhu, G., Butel, G., Lu, S. H., Wang, Y., Zhou, P., & Burge, J. H. (2011). Slope measuring metrology for precision free-form surfaces. In Proceedings - ASPE 2011 Spring Topical Meeting: Structured and Freeform Surfaces (pp. 43-48). (Proceedings - ASPE 2011 Spring Topical Meeting: Structured and Freeform Surfaces; Vol. 51).