Soft X-ray microscopy; a new technology for examination of parasitic specimens

W. J. Kozek, A. Nair, G. Denbeaux, C. Larabell, J. Brown, C. R. Sterling, S. Garlapati, C. C. Wang, W. Meyer-Ilse

Research output: Contribution to journalArticle

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)1452-1453
Number of pages2
JournalMicroscopy and Microanalysis
Volume9
Issue numberSUPPL. 2
StatePublished - Sep 4 2003

ASJC Scopus subject areas

  • Instrumentation

Cite this

Kozek, W. J., Nair, A., Denbeaux, G., Larabell, C., Brown, J., Sterling, C. R., Garlapati, S., Wang, C. C., & Meyer-Ilse, W. (2003). Soft X-ray microscopy; a new technology for examination of parasitic specimens. Microscopy and Microanalysis, 9(SUPPL. 2), 1452-1453.