Soft X-ray microscopy; a new technology for examination of parasitic specimens

W. J. Kozek, A. Nair, G. Denbeaux, C. Larabell, J. Brown, Charles R Sterling, S. Garlapati, C. C. Wang, W. Meyer-Ilse

Research output: Contribution to journalArticle

1 Citation (Scopus)
Original languageEnglish (US)
Pages (from-to)1452-1453
Number of pages2
JournalMicroscopy and Microanalysis
Volume9
Issue numberSUPPL. 2
StatePublished - 2003

Fingerprint

Microscopic examination
examination
microscopy
X rays
x rays

ASJC Scopus subject areas

  • Instrumentation

Cite this

Kozek, W. J., Nair, A., Denbeaux, G., Larabell, C., Brown, J., Sterling, C. R., ... Meyer-Ilse, W. (2003). Soft X-ray microscopy; a new technology for examination of parasitic specimens. Microscopy and Microanalysis, 9(SUPPL. 2), 1452-1453.

Soft X-ray microscopy; a new technology for examination of parasitic specimens. / Kozek, W. J.; Nair, A.; Denbeaux, G.; Larabell, C.; Brown, J.; Sterling, Charles R; Garlapati, S.; Wang, C. C.; Meyer-Ilse, W.

In: Microscopy and Microanalysis, Vol. 9, No. SUPPL. 2, 2003, p. 1452-1453.

Research output: Contribution to journalArticle

Kozek, WJ, Nair, A, Denbeaux, G, Larabell, C, Brown, J, Sterling, CR, Garlapati, S, Wang, CC & Meyer-Ilse, W 2003, 'Soft X-ray microscopy; a new technology for examination of parasitic specimens', Microscopy and Microanalysis, vol. 9, no. SUPPL. 2, pp. 1452-1453.
Kozek WJ, Nair A, Denbeaux G, Larabell C, Brown J, Sterling CR et al. Soft X-ray microscopy; a new technology for examination of parasitic specimens. Microscopy and Microanalysis. 2003;9(SUPPL. 2):1452-1453.
Kozek, W. J. ; Nair, A. ; Denbeaux, G. ; Larabell, C. ; Brown, J. ; Sterling, Charles R ; Garlapati, S. ; Wang, C. C. ; Meyer-Ilse, W. / Soft X-ray microscopy; a new technology for examination of parasitic specimens. In: Microscopy and Microanalysis. 2003 ; Vol. 9, No. SUPPL. 2. pp. 1452-1453.
@article{a5e1581709b145549a07ab7e1e91b2b6,
title = "Soft X-ray microscopy; a new technology for examination of parasitic specimens",
author = "Kozek, {W. J.} and A. Nair and G. Denbeaux and C. Larabell and J. Brown and Sterling, {Charles R} and S. Garlapati and Wang, {C. C.} and W. Meyer-Ilse",
year = "2003",
language = "English (US)",
volume = "9",
pages = "1452--1453",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "SUPPL. 2",

}

TY - JOUR

T1 - Soft X-ray microscopy; a new technology for examination of parasitic specimens

AU - Kozek, W. J.

AU - Nair, A.

AU - Denbeaux, G.

AU - Larabell, C.

AU - Brown, J.

AU - Sterling, Charles R

AU - Garlapati, S.

AU - Wang, C. C.

AU - Meyer-Ilse, W.

PY - 2003

Y1 - 2003

UR - http://www.scopus.com/inward/record.url?scp=0041386245&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0041386245&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0041386245

VL - 9

SP - 1452

EP - 1453

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - SUPPL. 2

ER -