Soft X-ray microscopy; a new technology for examination of parasitic specimens

W. J. Kozek, A. Nair, G. Denbeaux, C. Larabell, J. Brown, C. R. Sterling, S. Garlapati, C. C. Wang, W. Meyer-Ilse

Research output: Contribution to journalArticlepeer-review

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)1452-1453
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - 2003

ASJC Scopus subject areas

  • Instrumentation

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