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Soft X-ray microscopy; a new technology for examination of parasitic specimens
W. J. Kozek, A. Nair, G. Denbeaux, C. Larabell, J. Brown, C. R. Sterling, S. Garlapati, C. C. Wang, W. Meyer-Ilse
Research output: Contribution to journal › Article › peer-review
1
Scopus
citations