Soil moisture mapping using ERS-1/SAR in the Zwalm catchment

Z. Su, Peter A. Troch, F. P. Troch, L. Nachtergale, B. Cosyn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper we present some results of surface soil moisture retrieval using data from ERS- 1/SAR collected in 1994. Concurrent to ERS-1/SAR overflights field data were collected over two subcatchments of the Zwalm catchment in Belgium. After presenting a data processing procedure we apply a theoretical backscattering model to the data set. By comparing the calculated backscattering coefficients to the observed ones, we conclude that the measurements of surface roughness parameters in current remote sensing campaigns are not accurate enough for retrieving soil moisture using theoretical backscattering models. A method based on simultaneous retrieval of surface roughness parameters and soil moisture using multiple ERS- 1/SAR measurements is hence proposed. Promising results on retrieved soil moisture confirm the validity of the proposed method.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsEdwin T. Engman, Gerard Guyot, Carlo M. Marino
Pages112-122
Number of pages11
StatePublished - Dec 1 1995
Externally publishedYes
EventRemote Sensing for Agriculture, Forestry, and Natural Resources - Paris, Fr
Duration: Sep 26 1995Sep 28 1995

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2585
ISSN (Print)0277-786X

Other

OtherRemote Sensing for Agriculture, Forestry, and Natural Resources
CityParis, Fr
Period9/26/959/28/95

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Su, Z., Troch, P. A., Troch, F. P., Nachtergale, L., & Cosyn, B. (1995). Soil moisture mapping using ERS-1/SAR in the Zwalm catchment. In E. T. Engman, G. Guyot, & C. M. Marino (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (pp. 112-122). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2585).