Sol-gel-derived ferroelectric films as pyroelectric detectors in imaging applications

Gimtong T. Teowee, K. McCarthy, Donald R. Uhlmann

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Scopus citations

Abstract

This paper reviews the latest developments in pyroelectric devices for IR detection based on sol-gel derived ferroelectric thin films, highlighted by recent results from our laboratories. The optimization of sol-gel processing has led to ferroelectric films with pyroelectric coefficients as high as 200 nC/cm 2-K. Some modeling results of the thin film devices, which aid in device design, are also discussed. At the film level, various factors such as chemistries, microstructures and processing conditions all affect the final pyroelectric properties of the films. At the device level, processing compatibility and device layout need to be taken into account to optimize fully the device performance.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsEustace L. Dereniak, Robert E. Sampson
Pages38-50
Number of pages13
StatePublished - Jan 1 1996
Externally publishedYes
EventInfrared Detectors and Focal Plane Arrays IV - Orlando, FL, USA
Duration: Apr 10 1996Apr 11 1996

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2746

Other

OtherInfrared Detectors and Focal Plane Arrays IV
CityOrlando, FL, USA
Period4/10/964/11/96

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Teowee, G. T., McCarthy, K., & Uhlmann, D. R. (1996). Sol-gel-derived ferroelectric films as pyroelectric detectors in imaging applications. In E. L. Dereniak, & R. E. Sampson (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (pp. 38-50). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2746).