Space infrared telescope facility (SIRTF) science instruments

R. Ramos, S. M. Hing, C. A. Leidich, G. Fazio, J. R. Houck, G. Rieke

Research output: Contribution to journalArticle

1 Scopus citations

Abstract

The Space Infrared Telescope Facility (SIRTF) Project will perform infrared astronomical studies including imaging, photometry, and spectroscopy over the wavelength range of 1.8 μm to 700 μm. A complement of three Science Instruments designed to meet those objectives has been selected for an Instrument Definition Phase. The Instruments are: A. A Multiband Imaging Photometer (MIPS), to be developed by the University of Arizona; Principal Investigator - Dr. George Rieke. The MIPS is baselined to image individual sources at the background limit and diffraction limit between 3 and 7 μm, to provide super resolution between 10 and 30 μm, to provide imaging, super resolution, and surveying between 30 and 200 μm, and to provide point source photometry, radiometry, and surveying at wavelengths longer than 200 μm. The MIPS will also provide polarimetry in selected bands. The MIPS will cover the wavelength interval from 3 to 700 μm. B. An Infrared Array Camera (IRAC), to be developed by the Smithsonian Astrophysical Observatory; Principal Investigator - Dr. Giovanni G. Fazio. The IRAC is baselined for two-dimensional photometry, imaging and imaging polarimetry in either a wide field mode (5 arcmin square field of view) over the wavelength interval from 1.8 to 30 μm or a diffraction-limited (1.25 arcmin square field of view) mode, over the wavelength interval from 2.5 to 30 μm (with image quality at 1.8 μm no worse than at 2.5 μm) in a 1.25 X 1.25 arcmin field of view. C. An Infrared Spectrograph (IRS), to be developed by Cornell University; Principal Investigator - Dr. James R. Houck. The IRS is baselined to be capable of a low-resolution mode (λ/Δλ ≈100 from 2.5 to 200 μm, which is as close as possible to being limited in sensitivity by the natural backgrounds and to be capable of a high resolution mode (λ/Δλ = 2000 from 4 to 30 μm and λ/Δλ = 1700 to 2500 from 30 to 100 μm, and from λ/Δλ > 1000 from 120 - 200 μm. This paper describes the present baseline concepts of the three instruments.

Original languageEnglish (US)
Pages (from-to)2-24
Number of pages23
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume973
DOIs
StatePublished - Apr 27 1988

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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