Spark spectroscopy using charge transfer devices. Analysis, automated systems, and imaging

Robert S. Pomeroy, Rafi D. Jalkian, M Bonner Denton

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

An atomic emission spectroscopic system utilizing a spark source for excitation has been developed. The instrument employs a custom echelle spectrometer and a charge injection device (CID) array detector system. This system simultaneously covers wavelengths from 200 to 450 nm with a resolution of 0.02 nm at 300 nm. Solids sample analyses of steels and aluminums were used to demonstrate this system's speed, sensitivity, and flexibility. Automated systems for rapid qualitative and semi-quantitative screening of these materials will also be discussed. Another spectroscopic system based on a commercial imaging spectrograph and a charge-coupled device (CCD) array detector has been used to obtain temporally resolved spectral images of single sparks discharges.

Original languageEnglish (US)
Pages (from-to)1120-1125
Number of pages6
JournalApplied Spectroscopy
Volume45
Issue number7
StatePublished - Aug 1991
Externally publishedYes

Fingerprint

Charge transfer devices
charge transfer devices
sparks
Electric sparks
Spectroscopy
charge injection devices
Detectors
Imaging techniques
electric sparks
Charge injection
Spectrographs
Steel
detectors
Charge coupled devices
spectroscopy
spectrographs
Spectrometers
charge coupled devices
Screening
flexibility

ASJC Scopus subject areas

  • Spectroscopy
  • Instrumentation

Cite this

Spark spectroscopy using charge transfer devices. Analysis, automated systems, and imaging. / Pomeroy, Robert S.; Jalkian, Rafi D.; Denton, M Bonner.

In: Applied Spectroscopy, Vol. 45, No. 7, 08.1991, p. 1120-1125.

Research output: Contribution to journalArticle

Pomeroy, Robert S. ; Jalkian, Rafi D. ; Denton, M Bonner. / Spark spectroscopy using charge transfer devices. Analysis, automated systems, and imaging. In: Applied Spectroscopy. 1991 ; Vol. 45, No. 7. pp. 1120-1125.
@article{d12307923b6a46628bc1ead613fa7e59,
title = "Spark spectroscopy using charge transfer devices. Analysis, automated systems, and imaging",
abstract = "An atomic emission spectroscopic system utilizing a spark source for excitation has been developed. The instrument employs a custom echelle spectrometer and a charge injection device (CID) array detector system. This system simultaneously covers wavelengths from 200 to 450 nm with a resolution of 0.02 nm at 300 nm. Solids sample analyses of steels and aluminums were used to demonstrate this system's speed, sensitivity, and flexibility. Automated systems for rapid qualitative and semi-quantitative screening of these materials will also be discussed. Another spectroscopic system based on a commercial imaging spectrograph and a charge-coupled device (CCD) array detector has been used to obtain temporally resolved spectral images of single sparks discharges.",
author = "Pomeroy, {Robert S.} and Jalkian, {Rafi D.} and Denton, {M Bonner}",
year = "1991",
month = "8",
language = "English (US)",
volume = "45",
pages = "1120--1125",
journal = "Applied Spectroscopy",
issn = "0003-7028",
publisher = "Society for Applied Spectroscopy",
number = "7",

}

TY - JOUR

T1 - Spark spectroscopy using charge transfer devices. Analysis, automated systems, and imaging

AU - Pomeroy, Robert S.

AU - Jalkian, Rafi D.

AU - Denton, M Bonner

PY - 1991/8

Y1 - 1991/8

N2 - An atomic emission spectroscopic system utilizing a spark source for excitation has been developed. The instrument employs a custom echelle spectrometer and a charge injection device (CID) array detector system. This system simultaneously covers wavelengths from 200 to 450 nm with a resolution of 0.02 nm at 300 nm. Solids sample analyses of steels and aluminums were used to demonstrate this system's speed, sensitivity, and flexibility. Automated systems for rapid qualitative and semi-quantitative screening of these materials will also be discussed. Another spectroscopic system based on a commercial imaging spectrograph and a charge-coupled device (CCD) array detector has been used to obtain temporally resolved spectral images of single sparks discharges.

AB - An atomic emission spectroscopic system utilizing a spark source for excitation has been developed. The instrument employs a custom echelle spectrometer and a charge injection device (CID) array detector system. This system simultaneously covers wavelengths from 200 to 450 nm with a resolution of 0.02 nm at 300 nm. Solids sample analyses of steels and aluminums were used to demonstrate this system's speed, sensitivity, and flexibility. Automated systems for rapid qualitative and semi-quantitative screening of these materials will also be discussed. Another spectroscopic system based on a commercial imaging spectrograph and a charge-coupled device (CCD) array detector has been used to obtain temporally resolved spectral images of single sparks discharges.

UR - http://www.scopus.com/inward/record.url?scp=0026201279&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0026201279&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0026201279

VL - 45

SP - 1120

EP - 1125

JO - Applied Spectroscopy

JF - Applied Spectroscopy

SN - 0003-7028

IS - 7

ER -