Spark spectroscopy using charge transfer devices. Analysis, automated systems, and imaging

Robert S. Pomeroy, Rafi D. Jalkian, M. B. Denton

Research output: Contribution to journalArticle

9 Scopus citations

Abstract

An atomic emission spectroscopic system utilizing a spark source for excitation has been developed. The instrument employs a custom echelle spectrometer and a charge injection device (CID) array detector system. This system simultaneously covers wavelengths from 200 to 450 nm with a resolution of 0.02 nm at 300 nm. Solids sample analyses of steels and aluminums were used to demonstrate this system's speed, sensitivity, and flexibility. Automated systems for rapid qualitative and semi-quantitative screening of these materials will also be discussed. Another spectroscopic system based on a commercial imaging spectrograph and a charge-coupled device (CCD) array detector has been used to obtain temporally resolved spectral images of single sparks discharges.

Original languageEnglish (US)
Pages (from-to)1120-1125
Number of pages6
JournalApplied Spectroscopy
Volume45
Issue number7
DOIs
StatePublished - Jan 1 1991
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation
  • Spectroscopy

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