Spatial patterns in semiconductor lasers

G. Khitrova, F. Brown de Colstoun, C. W. Lowry, E. M. Wright, H. M. Gibbs, T. M. Brennan, B. E. Hammons

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

We have triggered transverse instabilities by injecting a CW monochromatic (10MHz) beam into a vertical-cavity surface-emitting laser (VCSEL). With increased injection current, the TEM00 transverse mode changes to a combination of TEM00, TEM*01 (doughnut), and TEM11. Various transverse modes patterns can then be produced by frequency tuning the injection. Interferometrically analyzing these patterns shows that some zero-field points are field vortices. The position of the vortex depends on injection frequency, power, polarization, and input position. The circulation of the phase gradient on any loop that encloses the vortex core is equal to 2kπ, with k (equal to one in our experiment) representing the order of the vortex, or topological charge.

Original languageEnglish (US)
Title of host publicationConference Proceedings - Lasers and Electro-Optics Society Annual Meeting
PublisherPubl by IEEE
Pages304-305
Number of pages2
ISBN (Print)0780312635
StatePublished - Dec 1 1993
EventAnnual Meeting of the IEEE Lasers and Electro-Optics Society - San jose, CA, USA
Duration: Nov 15 1993Nov 18 1993

Publication series

NameConference Proceedings - Lasers and Electro-Optics Society Annual Meeting

Other

OtherAnnual Meeting of the IEEE Lasers and Electro-Optics Society
CitySan jose, CA, USA
Period11/15/9311/18/93

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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  • Cite this

    Khitrova, G., Brown de Colstoun, F., Lowry, C. W., Wright, E. M., Gibbs, H. M., Brennan, T. M., & Hammons, B. E. (1993). Spatial patterns in semiconductor lasers. In Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting (pp. 304-305). (Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting). Publ by IEEE.