Spatially resolved spectroscopy of monolayer graphene on SiO2

A. Deshpande, W. Bao, F. Miao, C. N. Lau, B. J. Leroy

Research output: Contribution to journalArticle

199 Scopus citations

Abstract

We carried out scanning tunneling spectroscopy measurements on exfoliated monolayer graphene on SiO2 to probe the correlation between its electronic and structural properties. Maps of the local density of states are characterized by electron and hole puddles that arise due to long-range intravalley scattering from intrinsic ripples in graphene and random-charged impurities. At low energy, we observe short-range intervalley scattering which we attribute to lattice defects. Our results demonstrate that the electronic properties of graphene are influenced by intrinsic ripples, defects, and the underlying SiO2 substrate.

Original languageEnglish (US)
Article number205411
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume79
Issue number20
DOIs
StatePublished - May 1 2009

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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