Spectr and concentration dependence of the Verdet coefficient of dysprosium doped germanate glass

David E. Zelmon, William Poston, John D. Kunkel, Masoud Mollaee, Michael Li, Jie Zong, Arturo Chavez, Xiushan Zhu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

High power laser systems operating at mid IR wavelengths are required for medic applications, environment monitoring, and military applications. l of these systems require optic isolators to avoid feedback into the pump laser cavity. We present measurements of the Verdet coefficient of germanate glass with Dy concentrations varying from 20-50% at wavelengths between.4 and 1.5 microns. The results indicate a linear increase of the Verdet coefficient with impurity concentration and a Sellmeier like dependence on wavelength.

Original languageEnglish (US)
Title of host publicationComponents and Packaging for Laser Systems V
EditorsAlexei L. Glebov, Paul O. Leisher
PublisherSPIE
ISBN (Electronic)9781510624405
DOIs
StatePublished - Jan 1 2019
EventComponents and Packaging for Laser Systems V 2019 - San Francisco, United States
Duration: Feb 4 2019Feb 6 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10899
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceComponents and Packaging for Laser Systems V 2019
CountryUnited States
CitySan Francisco
Period2/4/192/6/19

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Zelmon, D. E., Poston, W., Kunkel, J. D., Mollaee, M., Li, M., Zong, J., Chavez, A., & Zhu, X. (2019). Spectr and concentration dependence of the Verdet coefficient of dysprosium doped germanate glass. In A. L. Glebov, & P. O. Leisher (Eds.), Components and Packaging for Laser Systems V [1089910] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10899). SPIE. https://doi.org/10.1117/12.2506615