Spectral characterization of linear isotropic and anisotropic dielectric materials using terahertz measurement systems

Jeffrey Seligman, Christopher Walker, Ben Sternberg, Christopher Green

Research output: ResearchConference contribution

Abstract

In this study, quasi-optical techniques are used to evaluate the properties of dielectric substrates at millimeter wave frequencies. Anisotropy with respect to wave polarization was observed in the composite materials using several instruments including the FTS, TDS, and THz VNA. The measurements were carried out from 200 GHz to 3000 GHz (3 THz ) depending on the instrument. Material loss deviated significantly above 500 GHz. Uniform plastics such as H/LDPE polyethylene were well behaved by comparison.

LanguageEnglish (US)
Title of host publication88th ARFTG Microwave Measurement Conference: Power Amplifiers and Systems Design for Wireless Application, ARFTG 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509045136
DOIs
StatePublished - Feb 1 2017
Event88th ARFTG Microwave Measurement Conference, ARFTG 2016 - Austin, United States
Duration: Dec 8 2016Dec 9 2016

Other

Other88th ARFTG Microwave Measurement Conference, ARFTG 2016
CountryUnited States
CityAustin
Period12/8/1612/9/16

Fingerprint

Low density polyethylenes
Millimeter waves
Polyethylenes
Anisotropy
Polarization
Plastics
Composite materials
Substrates
polarization (waves)
millimeter waves
polyethylenes
plastics
anisotropy
composite materials

Keywords

  • anisotropic
  • Dielectric material characterization
  • Fourier transforms
  • loss tangent
  • measurements
  • nondestructive testing
  • terahertz
  • time domain

ASJC Scopus subject areas

  • Instrumentation
  • Computer Networks and Communications
  • Electrical and Electronic Engineering

Cite this

Seligman, J., Walker, C., Sternberg, B., & Green, C. (2017). Spectral characterization of linear isotropic and anisotropic dielectric materials using terahertz measurement systems. In 88th ARFTG Microwave Measurement Conference: Power Amplifiers and Systems Design for Wireless Application, ARFTG 2016 [7839724] Institute of Electrical and Electronics Engineers Inc.. DOI: 10.1109/ARFTG.2016.7839724

Spectral characterization of linear isotropic and anisotropic dielectric materials using terahertz measurement systems. / Seligman, Jeffrey; Walker, Christopher; Sternberg, Ben; Green, Christopher.

88th ARFTG Microwave Measurement Conference: Power Amplifiers and Systems Design for Wireless Application, ARFTG 2016. Institute of Electrical and Electronics Engineers Inc., 2017. 7839724.

Research output: ResearchConference contribution

Seligman, J, Walker, C, Sternberg, B & Green, C 2017, Spectral characterization of linear isotropic and anisotropic dielectric materials using terahertz measurement systems. in 88th ARFTG Microwave Measurement Conference: Power Amplifiers and Systems Design for Wireless Application, ARFTG 2016., 7839724, Institute of Electrical and Electronics Engineers Inc., 88th ARFTG Microwave Measurement Conference, ARFTG 2016, Austin, United States, 12/8/16. DOI: 10.1109/ARFTG.2016.7839724
Seligman J, Walker C, Sternberg B, Green C. Spectral characterization of linear isotropic and anisotropic dielectric materials using terahertz measurement systems. In 88th ARFTG Microwave Measurement Conference: Power Amplifiers and Systems Design for Wireless Application, ARFTG 2016. Institute of Electrical and Electronics Engineers Inc.2017. 7839724. Available from, DOI: 10.1109/ARFTG.2016.7839724
Seligman, Jeffrey ; Walker, Christopher ; Sternberg, Ben ; Green, Christopher. / Spectral characterization of linear isotropic and anisotropic dielectric materials using terahertz measurement systems. 88th ARFTG Microwave Measurement Conference: Power Amplifiers and Systems Design for Wireless Application, ARFTG 2016. Institute of Electrical and Electronics Engineers Inc., 2017.
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