SSL design with LED binning tolerances

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Illumination systems suffer from tolerances like all optical systems, including gross, process, roughness, and system errors. A common system error in solid-state lighting (SSL) luminaires is source variation due to variation within selected LED bins. Tolerances of LED bins include peak or dominant wavelength and flux output. These bin variations lead to chromatic shifts in the resulting illumination distribution when discrete spectral emitters are mixed to provide a desired color. Software tools are developed to provide ease in inspection of color mixing of discrete spectral LEDs taking into account the selected bins for each LED. This tool is a graphical user interface (GUI) of standard LED products from a series of LED manufacturers. Using this tool the color mixing of red, green, and blue LEDs are presented, showing that there is a color shifts in the resulting distribution due to binning variation. Optics that have the potential to alleviate the color shifts due to LED bin tolerances are presented.

Original languageEnglish (US)
Title of host publicationIllumination Optics
DOIs
StatePublished - Nov 21 2008
EventIllumination Optics - Glasgow, United Kingdom
Duration: Sep 2 2008Sep 3 2008

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7103
ISSN (Print)0277-786X

Other

OtherIllumination Optics
CountryUnited Kingdom
CityGlasgow
Period9/2/089/3/08

Keywords

  • Color mixing
  • Illumination
  • LED
  • Optical design
  • Optimization
  • Solid-state lighting
  • Tolerancing

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Koshel, R. J. (2008). SSL design with LED binning tolerances. In Illumination Optics [710303] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7103). https://doi.org/10.1117/12.801180