Static tester for characterization of phase-change, dye–polymer, and magneto-optical media for optical data storage

Masud Mansuripur, J. Kevin Erwin, Warren Bletscher, Pramod Khulbe, Kayvan Sadeghi, Xiaodong Xun, Anurag Gupta, Sergio B. Mendes

Research output: Contribution to journalArticlepeer-review

28 Scopus citations

Abstract

We have designed and built a static tester around a commercially available polarized light microscope. This device employs two semiconductor laser diodes (at 643- and 680-nm wavelengths) for the purpose of recording small marks on various media for optical data storage and for the simultaneous monitoring of the recording process. We use one of the lasers in the single-pulse mode to write a mark on the sample and operate the other laser in the cw mode to monitor the recording process. The two laser beams are brought to coincident focus on the sample through the objective lens of the microscope. The reflected beams are sent through a polarizing beam splitter and thus divided into two branches, depending on whether they are p or s polarized. In each branch the beam is further divided into two according to the wavelength. The four beams thus produced are sent to four high-speed photodetectors, and the resulting signals are used to monitor the reflectance as well as the polarization state of the beam on reflection from the sample. We provide a comprehensive description of the tester’s design and operating principles. We also report preliminary results of measurements of phase-change, dye–polymer, and magneto-optical samples, which are currently of interest in the areas of writable and rewritable optical data storage.

Original languageEnglish (US)
Pages (from-to)7095-7104
Number of pages10
JournalApplied optics
Volume38
Issue number34
DOIs
StatePublished - Dec 1 1999

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

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