Stochastic analysis for crosstalk noise of coupled interconnects with process variations

Xin Li, Meiling Wang, Weiqing Tang, Huizhong Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

This paper proposes a new approach to analyze crosstalk of coupled interconnects in the presence of process variations. The suggested method translates correlated process variations into orthogonal random variables by Principle Component Analysis (PCA). Combined with Polynomial Chaos Expression (PCE), the technique utilizes Stochastic Collocation Method (SCM) to analyze the system response of coupled interconnects. A finite representation of interconnect crosstalk is obtained by projecting the infinite series representation onto a finite dimensional subspace. Experimental results demonstrate that the approach match well with HSPICE. The differences between the crosstalk obtained from the analytical method and HSPICE is about 2% or less. Furthermore the new approach shows good computation efficiency: much less running time has been observed over Monte Carlo SPICE simulation.

Original languageEnglish (US)
Title of host publicationProceedings - 2008 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT
Pages289-292
Number of pages4
DOIs
Publication statusPublished - 2008
EventIEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2008 - Minatec Grenoble, France
Duration: Jun 2 2008Jun 4 2008

Other

OtherIEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2008
CountryFrance
CityMinatec Grenoble
Period6/2/086/4/08

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Keywords

  • Crosstalk analysis
  • Polynomial chaos expression
  • Principle component analysis
  • Process variations
  • Stochastic collocation method

ASJC Scopus subject areas

  • Human-Computer Interaction
  • Electrical and Electronic Engineering

Cite this

Li, X., Wang, M., Tang, W., & Wu, H. (2008). Stochastic analysis for crosstalk noise of coupled interconnects with process variations. In Proceedings - 2008 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT (pp. 289-292). [4567298] https://doi.org/10.1109/ICICDT.2008.4567298