Stochastic analysis of interconnect delay in the presence of process variations

Xin Li, Janet M. Wang, Weiqing Tang, Huizhong Wu

Research output: Contribution to journalArticle

5 Scopus citations

Abstract

Process variations can reduce the accuracy in estimation of interconnect performance. This work presents a process variation based stochastic model and proposes an effective analytical method to estimate interconnect delay. The technique decouples the stochastic interconnect segments by an improved decoupling method. Combined with a polynomial chaos expression (PCE), this paper applies the stochastic Galerkin method (SGM) to analyze the system response. A finite representation of interconnect delay is then obtained with the complex approximation method and the bisection method. Results from the analysis match well with those from SPICE. Moreover, the method shows good computational efficiency, as the running time is much less than the SPICE simulation's.

Original languageEnglish (US)
Pages (from-to)304-309
Number of pages6
JournalPan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors
Volume29
Issue number2
StatePublished - Feb 1 2008

Keywords

  • Coupled interconnects
  • Delay estimation
  • Polynomial chaos expression
  • Process variations
  • Stochastic Galerkin method
  • Stochastic modeling

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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