Structural characterization of various chiral smectic-C phases by resonant X-ray scattering

P. Mach, R. Pindak, A. M. Levelut, P. Barois, H. T. Nguyen, C. C. Huang, Lars R Furenlid

Research output: Contribution to journalArticle

343 Citations (Scopus)

Abstract

We report the results of resonant x-ray diffraction at the sulfur K-edge performed upon free-standing films of a thiobenzoate liquid-crystal compound. Our data provide the first direct structural evidence of distinct periodicities in several chiral Sm-C phases, including 2-layer, 3-layer, and 4-layer superlattices in Sm-CA*, Sm-CF11*, and Sm-CF12*, respectively. In Sm-Cα*, periodicity incommensurate with the layer spacing was detected. The racemic compound version was also studied. The results are consistent with a "clock model" of the Sm-C* variant structures.

Original languageEnglish (US)
Pages (from-to)1015-1018
Number of pages4
JournalPhysical Review Letters
Volume81
Issue number5
StatePublished - 1998
Externally publishedYes

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scattering
periodic variations
x rays
clocks
superlattices
x ray diffraction
sulfur
liquid crystals
spacing

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Mach, P., Pindak, R., Levelut, A. M., Barois, P., Nguyen, H. T., Huang, C. C., & Furenlid, L. R. (1998). Structural characterization of various chiral smectic-C phases by resonant X-ray scattering. Physical Review Letters, 81(5), 1015-1018.

Structural characterization of various chiral smectic-C phases by resonant X-ray scattering. / Mach, P.; Pindak, R.; Levelut, A. M.; Barois, P.; Nguyen, H. T.; Huang, C. C.; Furenlid, Lars R.

In: Physical Review Letters, Vol. 81, No. 5, 1998, p. 1015-1018.

Research output: Contribution to journalArticle

Mach, P, Pindak, R, Levelut, AM, Barois, P, Nguyen, HT, Huang, CC & Furenlid, LR 1998, 'Structural characterization of various chiral smectic-C phases by resonant X-ray scattering', Physical Review Letters, vol. 81, no. 5, pp. 1015-1018.
Mach P, Pindak R, Levelut AM, Barois P, Nguyen HT, Huang CC et al. Structural characterization of various chiral smectic-C phases by resonant X-ray scattering. Physical Review Letters. 1998;81(5):1015-1018.
Mach, P. ; Pindak, R. ; Levelut, A. M. ; Barois, P. ; Nguyen, H. T. ; Huang, C. C. ; Furenlid, Lars R. / Structural characterization of various chiral smectic-C phases by resonant X-ray scattering. In: Physical Review Letters. 1998 ; Vol. 81, No. 5. pp. 1015-1018.
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