Structural characterization of various chiral smectic-C phases by resonant X-ray scattering

P. Mach, R. Pindak, A. M. Levelut, P. Barois, H. T. Nguyen, C. C. Huang, L. Furenlid

Research output: Contribution to journalArticle

346 Scopus citations

Abstract

We report the results of resonant x-ray diffraction at the sulfur K-edge performed upon free-standing films of a thiobenzoate liquid-crystal compound. Our data provide the first direct structural evidence of distinct periodicities in several chiral Sm-C phases, including 2-layer, 3-layer, and 4-layer superlattices in Sm-C*A, Sm-C*FI1, and Sm-C*FI2, respectively. In Sm-C*α, periodicity incommensurate with the layer spacing was detected. The racemic compound version was also studied. The results are consistent with a “clock model” of the Sm-C* variant structures.

Original languageEnglish (US)
Pages (from-to)1015-1018
Number of pages4
JournalPhysical review letters
Volume81
Issue number5
DOIs
StatePublished - Jan 1 1998
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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