Structure and scintillation properties of CsI(Tl) films on Si single crystal substrates

Lina Guo, Shuang Liu, Dejun Chen, Shangjian Zhang, Yong Liu, Zhiyong Zhong, Charles M Falco

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

CsI(Tl) scintillation films fabricated on glass substrates are widely applied for X-ray imaging because their ability to grow in micro-columnar structure and proper emission wavelength matching CCD cameras. But the coupling process between the CsI(Tl) films and Si-based photo detector would cause coupling loss. In this work, CsI(Tl) films were deposited on the orienting Si substrates and the Si substrates covered by the pre-deposited CsI nanolayers. Structure and scintillation properties of films were examined by using scanning electron microscopy, X-ray diffraction, photoluminescence and radioluminescent spectrum. The films deposited on the orienting Si substrates show the micro-columnar morphology with perfect single crystalline structure and the photoluminescence spectra with bimodal distribution. The performances of the films prepared on the pre-deposited CsI nanolayer, containing micro-columns structure and the light yield are improved.

Original languageEnglish (US)
Pages (from-to)225-229
Number of pages5
JournalApplied Surface Science
Volume384
DOIs
StatePublished - Oct 30 2016

Keywords

  • Photoluminescence
  • Scintillation films
  • Structure
  • Vacuum deposition

ASJC Scopus subject areas

  • Surfaces, Coatings and Films

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