Structure of amorphous silicon and silicon hydrides

T. A. Postol, Charles M. Falco, R. T. Kampwirth, Ivan K. Schuller, W. B. Yelon

Research output: Contribution to journalArticle

62 Scopus citations

Abstract

Neutron scattering measurements have been made on pure, hydrogenated, and deuterated samples of amorphous silicon (a-Si) in the wave-vector range 0.007-8.75-1. Small-angle data indicate structures in the samples of average radius of gyration as large as 270. Large-angle data show that for the concentrations we have measured (14%), the structure of a-Si is not altered by the incorporation of large amounts of H or D. The silicon-hydrogen and silicon-deuterium partial structure factors have also been obtained.

Original languageEnglish (US)
Pages (from-to)648-652
Number of pages5
JournalPhysical review letters
Volume45
Issue number8
DOIs
StatePublished - Jan 1 1980

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Postol, T. A., Falco, C. M., Kampwirth, R. T., Schuller, I. K., & Yelon, W. B. (1980). Structure of amorphous silicon and silicon hydrides. Physical review letters, 45(8), 648-652. https://doi.org/10.1103/PhysRevLett.45.648