Mapping of refractive index patterns with sub-wavelength resolution is achieved using Near-field Scanning Optical Microscopy (NSOM) in reflection mode. Imaging of index pattern is performed on surface gratings photo-imprinted in As2S3 films. The NSOM is adapted with a near infrared laser which wavelength (785 nm) is chosen to be within the transparency window of the glass film therefore allowing consistent measure of reflected light. Quantitative measurements of photo-induced index changes can then be obtained from knowledge of the initial film index. Images of gratings with a period of 0.5 micron are easily collected therefore demonstrating sub-wavelength spatial resolution. The technique permits to concurrently obtain a topographic image and index image of the gratings thereby permitting to quantify the extent of photodarkening and photoexpansion simultaneously. It is shown that relief gratings tend to vanish in films aged in air for several months however the index gratings remain.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Physical and Theoretical Chemistry
- Electrical and Electronic Engineering