Abstract
Mapping of refractive index patterns with sub-wavelength resolution is achieved using Near-field Scanning Optical Microscopy (NSOM) in reflection mode. Imaging of index pattern is performed on surface gratings photo-imprinted in As2S3 films. The NSOM is adapted with a near infrared laser which wavelength (785 nm) is chosen to be within the transparency window of the glass film therefore allowing consistent measure of reflected light. Quantitative measurements of photo-induced index changes can then be obtained from knowledge of the initial film index. Images of gratings with a period of 0.5 micron are easily collected therefore demonstrating sub-wavelength spatial resolution. The technique permits to concurrently obtain a topographic image and index image of the gratings thereby permitting to quantify the extent of photodarkening and photoexpansion simultaneously. It is shown that relief gratings tend to vanish in films aged in air for several months however the index gratings remain.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 4370-4373 |
| Number of pages | 4 |
| Journal | Optics Communications |
| Volume | 282 |
| Issue number | 22 |
| DOIs | |
| State | Published - Nov 15 2009 |
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ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
- Physical and Theoretical Chemistry
Cite this
Sub-wavelength imaging of photo-induced refractive index pattern in chalcogenide glass films. / Yang, Zhiyong; Anheier, Norman C.; Qiao, Hong A.; Lucas, Pierre.
In: Optics Communications, Vol. 282, No. 22, 15.11.2009, p. 4370-4373.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Sub-wavelength imaging of photo-induced refractive index pattern in chalcogenide glass films
AU - Yang, Zhiyong
AU - Anheier, Norman C.
AU - Qiao, Hong A.
AU - Lucas, Pierre
PY - 2009/11/15
Y1 - 2009/11/15
N2 - Mapping of refractive index patterns with sub-wavelength resolution is achieved using Near-field Scanning Optical Microscopy (NSOM) in reflection mode. Imaging of index pattern is performed on surface gratings photo-imprinted in As2S3 films. The NSOM is adapted with a near infrared laser which wavelength (785 nm) is chosen to be within the transparency window of the glass film therefore allowing consistent measure of reflected light. Quantitative measurements of photo-induced index changes can then be obtained from knowledge of the initial film index. Images of gratings with a period of 0.5 micron are easily collected therefore demonstrating sub-wavelength spatial resolution. The technique permits to concurrently obtain a topographic image and index image of the gratings thereby permitting to quantify the extent of photodarkening and photoexpansion simultaneously. It is shown that relief gratings tend to vanish in films aged in air for several months however the index gratings remain.
AB - Mapping of refractive index patterns with sub-wavelength resolution is achieved using Near-field Scanning Optical Microscopy (NSOM) in reflection mode. Imaging of index pattern is performed on surface gratings photo-imprinted in As2S3 films. The NSOM is adapted with a near infrared laser which wavelength (785 nm) is chosen to be within the transparency window of the glass film therefore allowing consistent measure of reflected light. Quantitative measurements of photo-induced index changes can then be obtained from knowledge of the initial film index. Images of gratings with a period of 0.5 micron are easily collected therefore demonstrating sub-wavelength spatial resolution. The technique permits to concurrently obtain a topographic image and index image of the gratings thereby permitting to quantify the extent of photodarkening and photoexpansion simultaneously. It is shown that relief gratings tend to vanish in films aged in air for several months however the index gratings remain.
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UR - http://www.scopus.com/inward/citedby.url?scp=70349263844&partnerID=8YFLogxK
U2 - 10.1016/j.optcom.2009.08.014
DO - 10.1016/j.optcom.2009.08.014
M3 - Article
AN - SCOPUS:70349263844
VL - 282
SP - 4370
EP - 4373
JO - Optics Communications
JF - Optics Communications
SN - 0030-4018
IS - 22
ER -