Subaperture stitching performance estimation

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

Subaperture stitching extends measurements such as interferometry by combining several overlapping measurements into a single, high-accuracy estimate of the overall image. In designing a subaperture measurement regimen, there are several tradeoffs related to size, quantity and locations of subapertures within the full aperture of the test optic. Understanding how individual subaperture measurement noise couples through these parameters into errors in the final stitched map is important for estimating overall system performance. In this work, we explore parametric rules for estimating the accuracy of stitched results based on subaperture geometry parameters and noise characteristics for a self-calibrating system where both a test optic and reference optic are simultaneously determined. From these rules, we examine types of errors introduced by stitching which enables confidence estimates for the final stitched map surface quality.

Original languageEnglish (US)
Title of host publicationOptical Manufacturing and Testing X
DOIs
StatePublished - Nov 28 2013
EventOptical Manufacturing and Testing X - San Diego, CA, United States
Duration: Aug 26 2013Aug 27 2013

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8838
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherOptical Manufacturing and Testing X
CountryUnited States
CitySan Diego, CA
Period8/26/138/27/13

Keywords

  • Metrology
  • Performance
  • Ring of subapertures
  • Stitching
  • Subaperture error analysis

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Smith, G. A., Zhao, C., Su, P., & Burge, J. H. (2013). Subaperture stitching performance estimation. In Optical Manufacturing and Testing X [88380D] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8838). https://doi.org/10.1117/12.2023643