Subaperture stitching surface errors due to noise

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Subaperture stitching is a popular method for extending small, subaperture interferometer measurements to cover largeaperture optics. The method is simple in that there are only two steps: 1) make multiple measurements across the surface and 2) use well-established software techniques to merge the individual measurements into one surface estimate. Because parts of the system must move between measurements, small misalignments between subapertures are unavoidable, but easily accommodated within the software. Unfortunately this process has the potential to introduce errors. In this work, we show how random noise in a circular ring of subapertures creates artifacts in low-order surface shape estimates. The magnitude of these errors depends on setup parameters such as the number of subapertures and their overlap, as well as the measurement noise within a single subaperture. Understanding the relationships between subaperture stitching configuration and surface artifacts is important when designing high-accuracy metrology systems which rely on subaperture stitching. This work will help metrology system designers incorporate subaperture stitching into error budgets and tolerances.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume9575
ISBN (Print)9781628417418
DOIs
StatePublished - 2015
EventOptical Manufacturing and Testing XI - San Diego, United States
Duration: Aug 9 2015Aug 11 2015

Other

OtherOptical Manufacturing and Testing XI
CountryUnited States
CitySan Diego
Period8/9/158/11/15

Fingerprint

Stitching
metrology
artifacts
Metrology
computer programs
estimates
noise measurement
random noise
misalignment
Software
budgets
Random Noise
Misalignment
interferometers
Interferometer
Estimate
optics
Tolerance
Optics
Overlap

Keywords

  • computational processing
  • interferometry
  • Metrology
  • model
  • noise
  • stitching
  • theory

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Smith, G. A., & Burge, J. H. (2015). Subaperture stitching surface errors due to noise. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 9575). [95750W] SPIE. https://doi.org/10.1117/12.2188085

Subaperture stitching surface errors due to noise. / Smith, Gregory A; Burge, James H.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9575 SPIE, 2015. 95750W.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Smith, GA & Burge, JH 2015, Subaperture stitching surface errors due to noise. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 9575, 95750W, SPIE, Optical Manufacturing and Testing XI, San Diego, United States, 8/9/15. https://doi.org/10.1117/12.2188085
Smith GA, Burge JH. Subaperture stitching surface errors due to noise. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9575. SPIE. 2015. 95750W https://doi.org/10.1117/12.2188085
Smith, Gregory A ; Burge, James H. / Subaperture stitching surface errors due to noise. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9575 SPIE, 2015.
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