Surface parameter based image estimation from application of a scattering model to polarized light measurements

Hanyu Zhan, Hanwan Jiang, David G. Voelz, Meridith Kathryn Kupinski

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

An important task for remote sensing applications is the characterization of material properties, which can be accomplished by estimating physics-based parameters from optical scattering off a target's surface. In this paper, a novel approach is described to generate parameter-based images by applying the modified polarimetric bidirectional reflectance distribution function (pBRDF) model to the polarimetric imaging measurements collected with the University of Arizona's Ground Multiangle SpectroPolarimetric Imager (Ground-MSPI). Values for complex refractive index (η), slope variance roughness (σ2) and diffuse scattering coefficient (ρd) for each pixel are jointly estimated. Images consisting of the parameter values are generated by using the estimation results and optimized by contrast-ratio enhancement algorithms. The approach offers significant potential for remote targets analysis and novel imaging technology development.

Original languageEnglish (US)
Title of host publicationPolarization Science and Remote Sensing VIII
PublisherSPIE
Volume10407
ISBN (Electronic)9781510612716
DOIs
StatePublished - Jan 1 2017
Externally publishedYes
EventPolarization Science and Remote Sensing VIII 2017 - San Diego, United States
Duration: Aug 8 2017Aug 9 2017

Other

OtherPolarization Science and Remote Sensing VIII 2017
CountryUnited States
CitySan Diego
Period8/8/178/9/17

Fingerprint

Light measurement
Light polarization
polarized light
Scattering
Imaging techniques
scattering
Imaging
Image sensors
Distribution functions
Remote sensing
bidirectional reflectance
Refractive index
Materials properties
Target
Physics
Surface roughness
Pixels
scattering coefficients
Imager
Reflectance

Keywords

  • Optical polarimetry
  • Polarimetric bidirectional reflectance distribution function
  • Remote sensing applications
  • Surface parameter estimation
  • Surface parameter-based image

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Zhan, H., Jiang, H., Voelz, D. G., & Kupinski, M. K. (2017). Surface parameter based image estimation from application of a scattering model to polarized light measurements. In Polarization Science and Remote Sensing VIII (Vol. 10407). [104070U] SPIE. https://doi.org/10.1117/12.2274972

Surface parameter based image estimation from application of a scattering model to polarized light measurements. / Zhan, Hanyu; Jiang, Hanwan; Voelz, David G.; Kupinski, Meridith Kathryn.

Polarization Science and Remote Sensing VIII. Vol. 10407 SPIE, 2017. 104070U.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zhan, H, Jiang, H, Voelz, DG & Kupinski, MK 2017, Surface parameter based image estimation from application of a scattering model to polarized light measurements. in Polarization Science and Remote Sensing VIII. vol. 10407, 104070U, SPIE, Polarization Science and Remote Sensing VIII 2017, San Diego, United States, 8/8/17. https://doi.org/10.1117/12.2274972
Zhan H, Jiang H, Voelz DG, Kupinski MK. Surface parameter based image estimation from application of a scattering model to polarized light measurements. In Polarization Science and Remote Sensing VIII. Vol. 10407. SPIE. 2017. 104070U https://doi.org/10.1117/12.2274972
Zhan, Hanyu ; Jiang, Hanwan ; Voelz, David G. ; Kupinski, Meridith Kathryn. / Surface parameter based image estimation from application of a scattering model to polarized light measurements. Polarization Science and Remote Sensing VIII. Vol. 10407 SPIE, 2017.
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