Surface Raman scattering of organic thin films on transition metal surfaces

Jeanne E. Pemberton, Mark A. Bryant, Susan L. Joa, Sean D. Garvey

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Recent advances in detector technology have enabled sensitivity limitations inherent in surface Raman scattering from thin organic films on metal surfaces to be overcome. The application of both surface enhanced Raman scattering and normal Raman scattering of organic monolayer films on metal surfaces in electrochemical and ambient environments is an area of active research in this laboratory. The use of surface selection rules for the development of detailed molecular pictures of these interfaces is discussed in this report. The application of these rules for determination of the orientation of self-assembled monolayers on Ag and Au surfaces in both electrochemical and ambient environments is used to demonstrate the approach. In addition, extension of surface Raman methods to the study of monolayer organic films on Pt surfaces is reported.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Int Soc for Optical Engineering
Pages108-116
Number of pages9
ISBN (Print)0819407828, 9780819407825
DOIs
StatePublished - 1992
EventApplied Spectroscopy in Materials Science II - Los Angeles, CA, USA
Duration: Jan 20 1992Jan 22 1992

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1636
ISSN (Print)0277-786X

Other

OtherApplied Spectroscopy in Materials Science II
CityLos Angeles, CA, USA
Period1/20/921/22/92

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Pemberton, J. E., Bryant, M. A., Joa, S. L., & Garvey, S. D. (1992). Surface Raman scattering of organic thin films on transition metal surfaces. In Proceedings of SPIE - The International Society for Optical Engineering (pp. 108-116). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1636). Publ by Int Soc for Optical Engineering. https://doi.org/10.1117/12.59302