Synthesis of high-level requirements models for automatic test generation

P. Gupta, S. J. Cunning, J. W. Rozenblit

Research output: Contribution to conferencePaper

3 Scopus citations

Abstract

This paper describes research and development of techniques to support automatic generation of test cases for event-oriented, real-time embedded systems. A consistent suite of test scenarios can assure consistency at all levels of design activities. Although we have developed algorithms designed to generate test scenarios from state-based functional requirements model, their applicability is severely limited without a means to automatically translate the model functions into a form that can be readily integrated with the algorithms. A method and tool that extract the model of requirements and synthesize an equivalent high-level functional representation are presented. The tool, called Requirements Model Code Synthesizer, has been applied to a number of design cases, one of which is described in this paper.

Original languageEnglish (US)
Pages76-82
Number of pages7
StatePublished - Jan 1 2001
Event8th Annual IEEE International Conference on the Workshop on the Engineering of Computer Based Systems - Washington, DC, United States
Duration: Apr 17 2001Apr 20 2001

Other

Other8th Annual IEEE International Conference on the Workshop on the Engineering of Computer Based Systems
CountryUnited States
CityWashington, DC
Period4/17/014/20/01

ASJC Scopus subject areas

  • Hardware and Architecture
  • Software

Fingerprint Dive into the research topics of 'Synthesis of high-level requirements models for automatic test generation'. Together they form a unique fingerprint.

  • Cite this

    Gupta, P., Cunning, S. J., & Rozenblit, J. W. (2001). Synthesis of high-level requirements models for automatic test generation. 76-82. Paper presented at 8th Annual IEEE International Conference on the Workshop on the Engineering of Computer Based Systems, Washington, DC, United States.