System Calibration for FastSPECT III: An Ultra-High Resolution CCD-Based Pinhole SPECT System

Ling Han, Luca Caucci, Brian W. Miller, Harrison H Barrett, James M. Woolfenden, Lars R Furenlid

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

FastSPECT III is a recently developed ultra-highresolution small-animal SPECT imaging system. With 20 CCDbased intensified quantum-imaging cameras (iQID) and 250micron diameter platinum pinhole apertures, this stationary SPECT system offers \sim 350 microns isotropic linear resolution. This paper presents a novel system calibration method for FastSPECT III and other high-resolution stationary pinholeSPECT systems. The performance of the new system calibration method was evaluated using multi-bed-position MLEM reconstruction and helically-scanned objects. Originally designed for high-resolution rodent brain imaging to study neurological pathologies, FastSPECT III now offers whole-body mouse imaging capabilities with ultra-high spatial resolution.

Original languageEnglish (US)
Title of host publication2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538622827
DOIs
Publication statusPublished - Nov 12 2018
Event2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Atlanta, United States
Duration: Oct 21 2017Oct 28 2017

Other

Other2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017
CountryUnited States
CityAtlanta
Period10/21/1710/28/17

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ASJC Scopus subject areas

  • Instrumentation
  • Radiology Nuclear Medicine and imaging
  • Nuclear and High Energy Physics

Cite this

Han, L., Caucci, L., Miller, B. W., Barrett, H. H., Woolfenden, J. M., & Furenlid, L. R. (2018). System Calibration for FastSPECT III: An Ultra-High Resolution CCD-Based Pinhole SPECT System. In 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings [8533027] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NSSMIC.2017.8533027