Systematic error of a large dynamic range aberrometer

Peng Wu, Edward DeHoog, James T Schwiegerling

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Shack-Hartmann aberrometers are routinely used for measuring ocular aberrations. In one configuration, the intermediate images of the Shack-Hartmann spots formed by the lenslet array are relayed by an imaging lens onto a sensor. A systematic introduction of spherical aberration that is strongly related to the power error (defocus) of the incident wavefront is observed in this configuration. We found that the largest component of this error is induced by the pupil aberration of the imaging relay lens. Some simulations and experimental results are demonstrated.

Original languageEnglish (US)
Pages (from-to)6376-6380
Number of pages5
JournalApplied Optics
Volume48
Issue number32
DOIs
StatePublished - Nov 10 2009

Fingerprint

Systematic errors
Aberrations
systematic errors
dynamic range
aberration
Lenses
lenses
Imaging techniques
relay
pupils
Wavefronts
configurations
sensors
Sensors
simulation

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Systematic error of a large dynamic range aberrometer. / Wu, Peng; DeHoog, Edward; Schwiegerling, James T.

In: Applied Optics, Vol. 48, No. 32, 10.11.2009, p. 6376-6380.

Research output: Contribution to journalArticle

Wu, Peng ; DeHoog, Edward ; Schwiegerling, James T. / Systematic error of a large dynamic range aberrometer. In: Applied Optics. 2009 ; Vol. 48, No. 32. pp. 6376-6380.
@article{43eb3737a1c64380962cb8afb2bb37a0,
title = "Systematic error of a large dynamic range aberrometer",
abstract = "Shack-Hartmann aberrometers are routinely used for measuring ocular aberrations. In one configuration, the intermediate images of the Shack-Hartmann spots formed by the lenslet array are relayed by an imaging lens onto a sensor. A systematic introduction of spherical aberration that is strongly related to the power error (defocus) of the incident wavefront is observed in this configuration. We found that the largest component of this error is induced by the pupil aberration of the imaging relay lens. Some simulations and experimental results are demonstrated.",
author = "Peng Wu and Edward DeHoog and Schwiegerling, {James T}",
year = "2009",
month = "11",
day = "10",
doi = "10.1364/AO.48.006376",
language = "English (US)",
volume = "48",
pages = "6376--6380",
journal = "Applied Optics",
issn = "1559-128X",
publisher = "The Optical Society",
number = "32",

}

TY - JOUR

T1 - Systematic error of a large dynamic range aberrometer

AU - Wu, Peng

AU - DeHoog, Edward

AU - Schwiegerling, James T

PY - 2009/11/10

Y1 - 2009/11/10

N2 - Shack-Hartmann aberrometers are routinely used for measuring ocular aberrations. In one configuration, the intermediate images of the Shack-Hartmann spots formed by the lenslet array are relayed by an imaging lens onto a sensor. A systematic introduction of spherical aberration that is strongly related to the power error (defocus) of the incident wavefront is observed in this configuration. We found that the largest component of this error is induced by the pupil aberration of the imaging relay lens. Some simulations and experimental results are demonstrated.

AB - Shack-Hartmann aberrometers are routinely used for measuring ocular aberrations. In one configuration, the intermediate images of the Shack-Hartmann spots formed by the lenslet array are relayed by an imaging lens onto a sensor. A systematic introduction of spherical aberration that is strongly related to the power error (defocus) of the incident wavefront is observed in this configuration. We found that the largest component of this error is induced by the pupil aberration of the imaging relay lens. Some simulations and experimental results are demonstrated.

UR - http://www.scopus.com/inward/record.url?scp=73349090557&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=73349090557&partnerID=8YFLogxK

U2 - 10.1364/AO.48.006376

DO - 10.1364/AO.48.006376

M3 - Article

C2 - 19904339

AN - SCOPUS:73349090557

VL - 48

SP - 6376

EP - 6380

JO - Applied Optics

JF - Applied Optics

SN - 1559-128X

IS - 32

ER -