Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis

Yijun Ding, David Coccarelli, Ava Hurlock, Joel A. Greenberg, Michael Gehm, Amit Ashok

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We develop a framework to analyze the information content of X-ray measurement data for the task of material discrimination. This task-specific information (TSI) analysis provides valuable information for system design and optimization. We employ Bhattacharyya distance (BD) between measurements of different materials as the TSI metric in our analysis framework, because BD is closely related to the bounds on the probability of error (Pe). We apply this framework to compare an X-ray diffraction-based system with an X-ray attenuation-based system for several materials and different detector geometries.

Original languageEnglish (US)
Title of host publicationAnomaly Detection and Imaging with X-Rays (ADIX) V
EditorsAmit Ashok, Joel A. Greenberg, Michael E. Gehm
PublisherSPIE
ISBN (Electronic)9781510635852
DOIs
StatePublished - 2020
EventAnomaly Detection and Imaging with X-Rays (ADIX) V 2020 - None, United States
Duration: Apr 27 2020May 8 2020

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11404
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceAnomaly Detection and Imaging with X-Rays (ADIX) V 2020
CountryUnited States
CityNone
Period4/27/205/8/20

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis'. Together they form a unique fingerprint.

  • Cite this

    Ding, Y., Coccarelli, D., Hurlock, A., Greenberg, J. A., Gehm, M., & Ashok, A. (2020). Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis. In A. Ashok, J. A. Greenberg, & M. E. Gehm (Eds.), Anomaly Detection and Imaging with X-Rays (ADIX) V [114040H] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11404). SPIE. https://doi.org/10.1117/12.2558267