Teraherlz birefringence for orientation analysis

Christian Jördens, Maik A Scheller, Matthias Wichmann, Martin Mikulics, Karin Wiesauer, Martin Koch

Research output: Contribution to journalArticle

49 Citations (Scopus)

Abstract

A terahertz time-domain spectrometer is employed to study different birefringent samples. We develop a method based on the temporal waveform and the impulse response of a sample to map the anisotropy of their inner structure. To validate our algorithm, we study the polarization-affecting structure of various classes of materials such as crystals, plastics, and natural products. Among all samples we observe the largest birefringence for a rutile crystal with △n = 3.3 at 1 THz.

Original languageEnglish (US)
Pages (from-to)2037-2044
Number of pages8
JournalApplied Optics
Volume48
Issue number11
DOIs
StatePublished - Apr 10 2009
Externally publishedYes

Fingerprint

Birefringence
birefringence
Crystals
Impulse response
Spectrometers
Anisotropy
Polarization
Plastics
rutile
crystals
impulses
waveforms
plastics
spectrometers
anisotropy
polarization
products

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Jördens, C., Scheller, M. A., Wichmann, M., Mikulics, M., Wiesauer, K., & Koch, M. (2009). Teraherlz birefringence for orientation analysis. Applied Optics, 48(11), 2037-2044. https://doi.org/10.1364/AO.48.002037

Teraherlz birefringence for orientation analysis. / Jördens, Christian; Scheller, Maik A; Wichmann, Matthias; Mikulics, Martin; Wiesauer, Karin; Koch, Martin.

In: Applied Optics, Vol. 48, No. 11, 10.04.2009, p. 2037-2044.

Research output: Contribution to journalArticle

Jördens, C, Scheller, MA, Wichmann, M, Mikulics, M, Wiesauer, K & Koch, M 2009, 'Teraherlz birefringence for orientation analysis', Applied Optics, vol. 48, no. 11, pp. 2037-2044. https://doi.org/10.1364/AO.48.002037
Jördens C, Scheller MA, Wichmann M, Mikulics M, Wiesauer K, Koch M. Teraherlz birefringence for orientation analysis. Applied Optics. 2009 Apr 10;48(11):2037-2044. https://doi.org/10.1364/AO.48.002037
Jördens, Christian ; Scheller, Maik A ; Wichmann, Matthias ; Mikulics, Martin ; Wiesauer, Karin ; Koch, Martin. / Teraherlz birefringence for orientation analysis. In: Applied Optics. 2009 ; Vol. 48, No. 11. pp. 2037-2044.
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