Teraherlz birefringence for orientation analysis

Christian Jördens, Maik Scheller, Matthias Wichmann, Martin Mikulics, Karin Wiesauer, Martin Koch

Research output: Contribution to journalArticle

50 Scopus citations

Abstract

A terahertz time-domain spectrometer is employed to study different birefringent samples. We develop a method based on the temporal waveform and the impulse response of a sample to map the anisotropy of their inner structure. To validate our algorithm, we study the polarization-affecting structure of various classes of materials such as crystals, plastics, and natural products. Among all samples we observe the largest birefringence for a rutile crystal with △n = 3.3 at 1 THz.

Original languageEnglish (US)
Pages (from-to)2037-2044
Number of pages8
JournalApplied optics
Volume48
Issue number11
DOIs
StatePublished - Apr 10 2009

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

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  • Cite this

    Jördens, C., Scheller, M., Wichmann, M., Mikulics, M., Wiesauer, K., & Koch, M. (2009). Teraherlz birefringence for orientation analysis. Applied optics, 48(11), 2037-2044. https://doi.org/10.1364/AO.48.002037