Terahertz characterization of graphene thin films on both sides of substrate

Min Liang, Mingguang Tuo, Zhen Li, Steven Cronin, Hao Xin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Graphene thin films on two sides of quartz substrate are characterized via Terahertz time-domain spectroscopy in this paper. The quartz substrate permittivity is first characterized. The graphene film is then treated as a surface boundary condition between the substrate and air. Using the uniform field approximation, the surface conductivities of graphene films are extracted. Compared to some previous approach, more accurate results in wider frequency range is achieved because of the second layer of graphene film and small substrate loss.

Original languageEnglish (US)
Title of host publicationIRMMW-THz 2012 - 37th International Conference on Infrared, Millimeter, and Terahertz Waves
DOIs
StatePublished - Dec 1 2012
Event37th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2012 - Wollongong, NSW, Australia
Duration: Sep 23 2012Sep 28 2012

Publication series

NameInternational Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
ISSN (Print)2162-2027
ISSN (Electronic)2162-2035

Other

Other37th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2012
CountryAustralia
CityWollongong, NSW
Period9/23/129/28/12

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ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Cite this

Liang, M., Tuo, M., Li, Z., Cronin, S., & Xin, H. (2012). Terahertz characterization of graphene thin films on both sides of substrate. In IRMMW-THz 2012 - 37th International Conference on Infrared, Millimeter, and Terahertz Waves [6380315] (International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz). https://doi.org/10.1109/IRMMW-THz.2012.6380315