Testing a 10 micron HgCdTe detector for ground-based exoplanet science

Brittany E. Miles, Philip Hinz, Andrew Skemer, Emily C. Martin, Deno Stelter

Research output: Chapter in Book/Report/Conference proceedingConference contribution


HgCdTe detectors with longer wavelength cutoffs were created for extending the lifetime of space-based applications because of their higher operating temperatures compared to arsenic doped silicon (Si:As) detectors. In addition to lower dark currents, the HgCdTe detectors also have higher quantum efficiencies compared to Si:As detectors. We are testing a HgCdTe detector with a 12.8 micron cutoff presented in Cabrera et al 2019 using HAWAII electronics in fast read-out mode to understand this array's viability in instruments behind future ELT s that will directly image Earth-like planets. An f/100 system is required to operate the detector on a thirty meter diameter telescope without saturating, therefore we are the same f# system on the modified cryostat used to test and characterize the detector. We will present initial results on the detector's quantum efficiency from 2 to 12 microns, read noise, dark current, and ability to tolerate flux levels that would be seen on future ELTs.

Original languageEnglish (US)
Title of host publicationTechniques and Instrumentation for Detection of Exoplanets X
EditorsStuart B. Shaklan, Garreth J. Ruane
ISBN (Electronic)9781510644847
StatePublished - 2021
EventTechniques and Instrumentation for Detection of Exoplanets X 2021 - San Diego, United States
Duration: Aug 1 2021Aug 5 2021

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferenceTechniques and Instrumentation for Detection of Exoplanets X 2021
Country/TerritoryUnited States
CitySan Diego


  • Direct Imaging
  • Exoplanets
  • Infrared Arrays
  • Infrared Detectors

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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