The 6.5 meter MMT's f/5 wide-field optics and instruments

D. Fabricant, R. Fata, B. McLeod, A. Szentgyorgyi, J. Barberis, H. Bergner, W. Brown, N. Caldwell, M. Conroy, R. Eng, H. Epps, G. Furesz, T. Gauron, J. Geary, R. Goddard, L. Hartmann, E. Hertz, M. Honsa, M. Mueller, T. NortonM. Ordway, J. Roll, G. Williams, D. Freedman-Woods, J. Zajac

Research output: Contribution to journalConference article

20 Scopus citations


In 2003, the converted MMT's wide-field f/5 focus was commissioned. A 1. 7-m diameter secondary and a large refractive corrector offer a 1° diameter field of view for spectroscopy and a 0.5° diameter field of view for imaging. Stellar images during excellent seeing are smaller than 0.5″ FWHM across the spectroscopic field of view, and smaller than 0.4″ across the imaging field of view. Three wide-field f/5 instruments are now in routine operation: Hectospec (an R∼1000 optical spectrograph fed by 300 robotically-positioned optical fibers), Hectochelle (an R∼40,000 optical spectrograph fed by the same fibers), and Megacam (a 340 megapixel, 36 CCD optical imager covering a 25′ by 25′ format).

Original languageEnglish (US)
Pages (from-to)767-778
Number of pages12
JournalProceedings of SPIE - The International Society for Optical Engineering
Issue numberPART 2
StatePublished - Dec 24 2004
EventGround-based Instrumentation for Astronomy - Glasgow, United Kingdom
Duration: Jun 21 2004Jun 25 2004



  • Ccd mosaic
  • Imagers
  • Optical design
  • Spectrographs
  • Telescopes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Fabricant, D., Fata, R., McLeod, B., Szentgyorgyi, A., Barberis, J., Bergner, H., Brown, W., Caldwell, N., Conroy, M., Eng, R., Epps, H., Furesz, G., Gauron, T., Geary, J., Goddard, R., Hartmann, L., Hertz, E., Honsa, M., Mueller, M., ... Zajac, J. (2004). The 6.5 meter MMT's f/5 wide-field optics and instruments. Proceedings of SPIE - The International Society for Optical Engineering, 5492(PART 2), 767-778.