The atomic force microscope: A tool for science and industry

S. A.C. Gould; B. Drake; C. B. Prater; A. L. Weisenhorn; S. Manne; G. L. Kelderman; H. J. Butt; H. Hansma; P. K. Hansma; S. Magonov; H. J. Cantow

doi:10.1016/0304-3991(90)90011-A

The atomic force microscope: A tool for science and industry

S. A.C. Gould, B. Drake, C. B. Prater, A. L. Weisenhorn, S. Manne, G. L. Kelderman, H. J. Butt, H. Hansma, P. K. Hansma, S. Magonov, H. J. Cantow

Research output: Contribution to journal › Article › peer-review

61 Scopus citations

Abstract

Images of graphite and RuCl₃ show that the atomic force microscope (AFM) is capable of imaging rigid samples with atomic resolution. Images of photographic film showing the emulsion demonstrate the potential of the microscope for industrial quality control. An image of a stoma on a leaf shows that the microscope is gentle enough not to damage surfaces, even of soft biological samples.

Original language	English (US)
Pages (from-to)	93-98
Number of pages	6
Journal	Ultramicroscopy
Volume	33
Issue number	2
DOIs	https://doi.org/10.1016/0304-3991(90)90011-A
State	Published - Aug 1990
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/0304-3991(90)90011-A

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title = "The atomic force microscope: A tool for science and industry",

abstract = "Images of graphite and RuCl3 show that the atomic force microscope (AFM) is capable of imaging rigid samples with atomic resolution. Images of photographic film showing the emulsion demonstrate the potential of the microscope for industrial quality control. An image of a stoma on a leaf shows that the microscope is gentle enough not to damage surfaces, even of soft biological samples.",

author = "Gould, {S. A.C.} and B. Drake and Prater, {C. B.} and Weisenhorn, {A. L.} and S. Manne and Kelderman, {G. L.} and Butt, {H. J.} and H. Hansma and Hansma, {P. K.} and S. Magonov and Cantow, {H. J.}",

year = "1990",

month = aug,

doi = "10.1016/0304-3991(90)90011-A",

language = "English (US)",

volume = "33",

pages = "93--98",

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T1 - The atomic force microscope

T2 - A tool for science and industry

AU - Gould, S. A.C.

AU - Drake, B.

AU - Prater, C. B.

AU - Weisenhorn, A. L.

AU - Manne, S.

AU - Kelderman, G. L.

AU - Butt, H. J.

AU - Hansma, H.

AU - Hansma, P. K.

AU - Magonov, S.

AU - Cantow, H. J.

PY - 1990/8

Y1 - 1990/8

N2 - Images of graphite and RuCl3 show that the atomic force microscope (AFM) is capable of imaging rigid samples with atomic resolution. Images of photographic film showing the emulsion demonstrate the potential of the microscope for industrial quality control. An image of a stoma on a leaf shows that the microscope is gentle enough not to damage surfaces, even of soft biological samples.

AB - Images of graphite and RuCl3 show that the atomic force microscope (AFM) is capable of imaging rigid samples with atomic resolution. Images of photographic film showing the emulsion demonstrate the potential of the microscope for industrial quality control. An image of a stoma on a leaf shows that the microscope is gentle enough not to damage surfaces, even of soft biological samples.

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JF - Ultramicroscopy

SN - 0304-3991

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