The atomic force microscope: A tool for science and industry

S. A C Gould, B. Drake, C. B. Prater, A. L. Weisenhorn, Srinivas Manne, G. L. Kelderman, H. J. Butt, H. Hansma, P. K. Hansma, S. Magonov, H. J. Cantow

Research output: Contribution to journal › Article

57 Citations (Scopus)

Abstract

Images of graphite and RuCl3 show that the atomic force microscope (AFM) is capable of imaging rigid samples with atomic resolution. Images of photographic film showing the emulsion demonstrate the potential of the microscope for industrial quality control. An image of a stoma on a leaf shows that the microscope is gentle enough not to damage surfaces, even of soft biological samples.

Original languageEnglish (US)
Pages (from-to)93-98
Number of pages6
JournalUltramicroscopy
Volume33
Issue number2
DOIs
StatePublished - 1990
Externally publishedYes

Fingerprint

Microscopes
industries
microscopes
photographic film
Photographic films
Industry
Graphite
quality control
Emulsions
leaves
emulsions
Quality control
graphite
damage
Imaging techniques

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

Gould, S. A. C., Drake, B., Prater, C. B., Weisenhorn, A. L., Manne, S., Kelderman, G. L., ... Cantow, H. J. (1990). The atomic force microscope: A tool for science and industry. Ultramicroscopy, 33(2), 93-98. https://doi.org/10.1016/0304-3991(90)90011-A

The atomic force microscope : A tool for science and industry. / Gould, S. A C; Drake, B.; Prater, C. B.; Weisenhorn, A. L.; Manne, Srinivas; Kelderman, G. L.; Butt, H. J.; Hansma, H.; Hansma, P. K.; Magonov, S.; Cantow, H. J.

In: Ultramicroscopy, Vol. 33, No. 2, 1990, p. 93-98.

Research output: Contribution to journal › Article

Gould, SAC, Drake, B, Prater, CB, Weisenhorn, AL, Manne, S, Kelderman, GL, Butt, HJ, Hansma, H, Hansma, PK, Magonov, S & Cantow, HJ 1990, 'The atomic force microscope: A tool for science and industry', Ultramicroscopy, vol. 33, no. 2, pp. 93-98. https://doi.org/10.1016/0304-3991(90)90011-A
Gould SAC, Drake B, Prater CB, Weisenhorn AL, Manne S, Kelderman GL et al. The atomic force microscope: A tool for science and industry. Ultramicroscopy. 1990;33(2):93-98. https://doi.org/10.1016/0304-3991(90)90011-A
Gould, S. A C ; Drake, B. ; Prater, C. B. ; Weisenhorn, A. L. ; Manne, Srinivas ; Kelderman, G. L. ; Butt, H. J. ; Hansma, H. ; Hansma, P. K. ; Magonov, S. ; Cantow, H. J. / The atomic force microscope : A tool for science and industry. In: Ultramicroscopy. 1990 ; Vol. 33, No. 2. pp. 93-98.
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