Abstract
The atomic force microscope (AFM), a prominent member of the new class of scanning near-field microscopes, has become a standard instrument to image the topography of surfaces with high resolution. In addition, the AFM is more and more used to study other local surface properties, like the local surface charge density, the surface energy, or viscoelastic properties. Beside its analytical capabilities, surfaces can be modified with the AFM tip. Examples of all three applications are given and future possibilities are discussed.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 601-612 |
| Number of pages | 12 |
| Journal | Biosensors and Bioelectronics |
| Volume | 11 |
| Issue number | 6-7 |
| DOIs | |
| State | Published - 1996 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Biotechnology
- Analytical Chemistry
- Electrochemistry
Cite this
The atomic force microscope as a tool to study and manipulate local surface properties. / Jaschke, Manfred; Butt, Hans Jürgen; Manne, Srinivas; Gaub, Hermann E.; Hasemann, Olaf; Krimphove, Frank; Wolff, Elmar K.
In: Biosensors and Bioelectronics, Vol. 11, No. 6-7, 1996, p. 601-612.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - The atomic force microscope as a tool to study and manipulate local surface properties
AU - Jaschke, Manfred
AU - Butt, Hans Jürgen
AU - Manne, Srinivas
AU - Gaub, Hermann E.
AU - Hasemann, Olaf
AU - Krimphove, Frank
AU - Wolff, Elmar K.
PY - 1996
Y1 - 1996
N2 - The atomic force microscope (AFM), a prominent member of the new class of scanning near-field microscopes, has become a standard instrument to image the topography of surfaces with high resolution. In addition, the AFM is more and more used to study other local surface properties, like the local surface charge density, the surface energy, or viscoelastic properties. Beside its analytical capabilities, surfaces can be modified with the AFM tip. Examples of all three applications are given and future possibilities are discussed.
AB - The atomic force microscope (AFM), a prominent member of the new class of scanning near-field microscopes, has become a standard instrument to image the topography of surfaces with high resolution. In addition, the AFM is more and more used to study other local surface properties, like the local surface charge density, the surface energy, or viscoelastic properties. Beside its analytical capabilities, surfaces can be modified with the AFM tip. Examples of all three applications are given and future possibilities are discussed.
UR - http://www.scopus.com/inward/record.url?scp=0029946006&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0029946006&partnerID=8YFLogxK
U2 - 10.1016/0956-5663(96)83295-7
DO - 10.1016/0956-5663(96)83295-7
M3 - Article
AN - SCOPUS:0029946006
VL - 11
SP - 601
EP - 612
JO - Biosensors
JF - Biosensors
SN - 0956-5663
IS - 6-7
ER -