The atomic force microscope as a tool to study and manipulate local surface properties

Manfred Jaschke; Hans Jürgen Butt; Srin Manne; Hermann E. Gaub; Olaf Hasemann; Frank Krimphove; Elmar K. Wolff

doi:10.1016/0956-5663(96)83295-7

The atomic force microscope as a tool to study and manipulate local surface properties

Manfred Jaschke, Hans Jürgen Butt, Srin Manne, Hermann E. Gaub, Olaf Hasemann, Frank Krimphove, Elmar K. Wolff

Research output: Contribution to journal › Conference article › peer-review

25 Scopus citations

Abstract

The atomic force microscope (AFM), a prominent member of the new class of scanning near-field microscopes, has become a standard instrument to image the topography of surfaces with high resolution. In addition, the AFM is more and more used to study other local surface properties, like the local surface charge density, the surface energy, or viscoelastic properties. Beside its analytical capabilities, surfaces can be modified with the AFM tip. Examples of all three applications are given and future possibilities are discussed.

Original language	English (US)
Pages (from-to)	601-612
Number of pages	12
Journal	Biosensors and Bioelectronics
Volume	11
Issue number	6-7
DOIs	https://doi.org/10.1016/0956-5663(96)83295-7
State	Published - 1996
Externally published	Yes
Event	Proceedings of the 1995 Conference on Artificial Biosensing Interfaces - Tampere, Finl Duration: Jun 17 1995 → Jun 20 1995

ASJC Scopus subject areas

Biotechnology
Biophysics
Biomedical Engineering
Electrochemistry

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title = "The atomic force microscope as a tool to study and manipulate local surface properties",

abstract = "The atomic force microscope (AFM), a prominent member of the new class of scanning near-field microscopes, has become a standard instrument to image the topography of surfaces with high resolution. In addition, the AFM is more and more used to study other local surface properties, like the local surface charge density, the surface energy, or viscoelastic properties. Beside its analytical capabilities, surfaces can be modified with the AFM tip. Examples of all three applications are given and future possibilities are discussed.",

author = "Manfred Jaschke and Butt, {Hans J{\"u}rgen} and Srin Manne and Gaub, {Hermann E.} and Olaf Hasemann and Frank Krimphove and Wolff, {Elmar K.}",

note = "Funding Information: This work was supported by the Deutsche Forschungs-gemeinschaft Schwerpunktprogramm Neue mikroskop-ische Techniken far Biologie und Medizin. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.; Proceedings of the 1995 Conference on Artificial Biosensing Interfaces ; Conference date: 17-06-1995 Through 20-06-1995",

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T1 - The atomic force microscope as a tool to study and manipulate local surface properties

AU - Jaschke, Manfred

AU - Butt, Hans Jürgen

AU - Manne, Srin

AU - Gaub, Hermann E.

AU - Hasemann, Olaf

AU - Krimphove, Frank

AU - Wolff, Elmar K.

N1 - Funding Information: This work was supported by the Deutsche Forschungs-gemeinschaft Schwerpunktprogramm Neue mikroskop-ische Techniken far Biologie und Medizin. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.

PY - 1996

Y1 - 1996

N2 - The atomic force microscope (AFM), a prominent member of the new class of scanning near-field microscopes, has become a standard instrument to image the topography of surfaces with high resolution. In addition, the AFM is more and more used to study other local surface properties, like the local surface charge density, the surface energy, or viscoelastic properties. Beside its analytical capabilities, surfaces can be modified with the AFM tip. Examples of all three applications are given and future possibilities are discussed.

AB - The atomic force microscope (AFM), a prominent member of the new class of scanning near-field microscopes, has become a standard instrument to image the topography of surfaces with high resolution. In addition, the AFM is more and more used to study other local surface properties, like the local surface charge density, the surface energy, or viscoelastic properties. Beside its analytical capabilities, surfaces can be modified with the AFM tip. Examples of all three applications are given and future possibilities are discussed.

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DO - 10.1016/0956-5663(96)83295-7

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AN - SCOPUS:0029946006

VL - 11

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EP - 612

JO - Biosensors and Bioelectronics

JF - Biosensors and Bioelectronics

SN - 0956-5663

IS - 6-7

T2 - Proceedings of the 1995 Conference on Artificial Biosensing Interfaces

Y2 - 17 June 1995 through 20 June 1995

ER -

The atomic force microscope as a tool to study and manipulate local surface properties

Abstract

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