The atomic force microscope as a tool to study and manipulate local surface properties

Manfred Jaschke; Hans Jürgen Butt; Srin Manne; Hermann E. Gaub; Olaf Hasemann; Frank Krimphove; Elmar K. Wolff

doi:10.1016/0956-5663(96)83295-7

The atomic force microscope as a tool to study and manipulate local surface properties

Manfred Jaschke, Hans Jürgen Butt, Srin Manne, Hermann E. Gaub, Olaf Hasemann, Frank Krimphove, Elmar K. Wolff

Research output: Contribution to journal › Conference article › peer-review

24 Scopus citations

Abstract

The atomic force microscope (AFM), a prominent member of the new class of scanning near-field microscopes, has become a standard instrument to image the topography of surfaces with high resolution. In addition, the AFM is more and more used to study other local surface properties, like the local surface charge density, the surface energy, or viscoelastic properties. Beside its analytical capabilities, surfaces can be modified with the AFM tip. Examples of all three applications are given and future possibilities are discussed.

Original language	English (US)
Pages (from-to)	601-612
Number of pages	12
Journal	Biosensors and Bioelectronics
Volume	11
Issue number	6-7
DOIs	https://doi.org/10.1016/0956-5663(96)83295-7
State	Published - Jan 1 1996
Externally published	Yes
Event	Proceedings of the 1995 Conference on Artificial Biosensing Interfaces - Tampere, Finl Duration: Jun 17 1995 → Jun 20 1995

ASJC Scopus subject areas

Biotechnology
Biophysics
Biomedical Engineering
Electrochemistry

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abstract = "The atomic force microscope (AFM), a prominent member of the new class of scanning near-field microscopes, has become a standard instrument to image the topography of surfaces with high resolution. In addition, the AFM is more and more used to study other local surface properties, like the local surface charge density, the surface energy, or viscoelastic properties. Beside its analytical capabilities, surfaces can be modified with the AFM tip. Examples of all three applications are given and future possibilities are discussed.",

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AU - Jaschke, Manfred

AU - Butt, Hans Jürgen

AU - Manne, Srin

AU - Gaub, Hermann E.

AU - Hasemann, Olaf

AU - Krimphove, Frank

AU - Wolff, Elmar K.

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AB - The atomic force microscope (AFM), a prominent member of the new class of scanning near-field microscopes, has become a standard instrument to image the topography of surfaces with high resolution. In addition, the AFM is more and more used to study other local surface properties, like the local surface charge density, the surface energy, or viscoelastic properties. Beside its analytical capabilities, surfaces can be modified with the AFM tip. Examples of all three applications are given and future possibilities are discussed.

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