The atomic force microscope as a tool to study and manipulate local surface properties

Manfred Jaschke; Hans Jürgen Butt; Srin Manne; Hermann E. Gaub; Olaf Hasemann; Frank Krimphove; Elmar K. Wolff

doi:10.1016/0956-5663(96)83295-7

The atomic force microscope as a tool to study and manipulate local surface properties

Manfred Jaschke, Hans Jürgen Butt, Srin Manne, Hermann E. Gaub, Olaf Hasemann, Frank Krimphove, Elmar K. Wolff

Physics

Research output: Contribution to journal › Conference article

21 Scopus citations

Abstract

The atomic force microscope (AFM), a prominent member of the new class of scanning near-field microscopes, has become a standard instrument to image the topography of surfaces with high resolution. In addition, the AFM is more and more used to study other local surface properties, like the local surface charge density, the surface energy, or viscoelastic properties. Beside its analytical capabilities, surfaces can be modified with the AFM tip. Examples of all three applications are given and future possibilities are discussed.

Original language	English (US)
Pages (from-to)	601-612
Number of pages	12
Journal	Biosensors and Bioelectronics
Volume	11
Issue number	6-7
DOIs	https://doi.org/10.1016/0956-5663(96)83295-7
State	Published - Jan 1 1996
Event	Proceedings of the 1995 Conference on Artificial Biosensing Interfaces - Tampere, Finl Duration: Jun 17 1995 → Jun 20 1995

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ASJC Scopus subject areas

Biotechnology
Biophysics
Biomedical Engineering
Electrochemistry

Cite this

Jaschke, M., Butt, H. J., Manne, S., Gaub, H. E., Hasemann, O., Krimphove, F., & Wolff, E. K. (1996). The atomic force microscope as a tool to study and manipulate local surface properties. Biosensors and Bioelectronics, 11(6-7), 601-612. https://doi.org/10.1016/0956-5663(96)83295-7

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AU - Hasemann, Olaf

AU - Krimphove, Frank

AU - Wolff, Elmar K.

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10.1016/0956-5663(96)83295-7