The atomic force microscope as a tool to study and manipulate local surface properties

Manfred Jaschke, Hans Jürgen Butt, Srin Manne, Hermann E. Gaub, Olaf Hasemann, Frank Krimphove, Elmar K. Wolff

Research output: Contribution to journalConference article

21 Scopus citations

Abstract

The atomic force microscope (AFM), a prominent member of the new class of scanning near-field microscopes, has become a standard instrument to image the topography of surfaces with high resolution. In addition, the AFM is more and more used to study other local surface properties, like the local surface charge density, the surface energy, or viscoelastic properties. Beside its analytical capabilities, surfaces can be modified with the AFM tip. Examples of all three applications are given and future possibilities are discussed.

Original languageEnglish (US)
Pages (from-to)601-612
Number of pages12
JournalBiosensors and Bioelectronics
Volume11
Issue number6-7
DOIs
StatePublished - Jan 1 1996
EventProceedings of the 1995 Conference on Artificial Biosensing Interfaces - Tampere, Finl
Duration: Jun 17 1995Jun 20 1995

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ASJC Scopus subject areas

  • Biotechnology
  • Biophysics
  • Biomedical Engineering
  • Electrochemistry

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