Abstract
The atomic force microscope (AFM), a prominent member of the new class of scanning near-field microscopes, has become a standard instrument to image the topography of surfaces with high resolution. In addition, the AFM is more and more used to study other local surface properties, like the local surface charge density, the surface energy, or viscoelastic properties. Beside its analytical capabilities, surfaces can be modified with the AFM tip. Examples of all three applications are given and future possibilities are discussed.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 601-612 |
| Number of pages | 12 |
| Journal | Biosensors and Bioelectronics |
| Volume | 11 |
| Issue number | 6-7 |
| DOIs | |
| State | Published - Jan 1 1996 |
| Externally published | Yes |
| Event | Proceedings of the 1995 Conference on Artificial Biosensing Interfaces - Tampere, Finl Duration: Jun 17 1995 → Jun 20 1995 |
ASJC Scopus subject areas
- Biotechnology
- Biophysics
- Biomedical Engineering
- Electrochemistry
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Cite this
Jaschke, M., Butt, H. J., Manne, S., Gaub, H. E., Hasemann, O., Krimphove, F., & Wolff, E. K. (1996). The atomic force microscope as a tool to study and manipulate local surface properties. Biosensors and Bioelectronics, 11(6-7), 601-612. https://doi.org/10.1016/0956-5663(96)83295-7