The atomic force microscope as a tool to study and manipulate local surface properties

Manfred Jaschke, Hans Jürgen Butt, Srinivas Manne, Hermann E. Gaub, Olaf Hasemann, Frank Krimphove, Elmar K. Wolff

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

The atomic force microscope (AFM), a prominent member of the new class of scanning near-field microscopes, has become a standard instrument to image the topography of surfaces with high resolution. In addition, the AFM is more and more used to study other local surface properties, like the local surface charge density, the surface energy, or viscoelastic properties. Beside its analytical capabilities, surfaces can be modified with the AFM tip. Examples of all three applications are given and future possibilities are discussed.

Original languageEnglish (US)
Pages (from-to)601-612
Number of pages12
JournalBiosensors and Bioelectronics
Volume11
Issue number6-7
DOIs
StatePublished - 1996
Externally publishedYes

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Surface Properties
Surface properties
Microscopes
Surface charge
Charge density
Interfacial energy
Topography
Scanning

ASJC Scopus subject areas

  • Biotechnology
  • Analytical Chemistry
  • Electrochemistry

Cite this

The atomic force microscope as a tool to study and manipulate local surface properties. / Jaschke, Manfred; Butt, Hans Jürgen; Manne, Srinivas; Gaub, Hermann E.; Hasemann, Olaf; Krimphove, Frank; Wolff, Elmar K.

In: Biosensors and Bioelectronics, Vol. 11, No. 6-7, 1996, p. 601-612.

Research output: Contribution to journalArticle

Jaschke, M, Butt, HJ, Manne, S, Gaub, HE, Hasemann, O, Krimphove, F & Wolff, EK 1996, 'The atomic force microscope as a tool to study and manipulate local surface properties', Biosensors and Bioelectronics, vol. 11, no. 6-7, pp. 601-612. https://doi.org/10.1016/0956-5663(96)83295-7
Jaschke, Manfred ; Butt, Hans Jürgen ; Manne, Srinivas ; Gaub, Hermann E. ; Hasemann, Olaf ; Krimphove, Frank ; Wolff, Elmar K. / The atomic force microscope as a tool to study and manipulate local surface properties. In: Biosensors and Bioelectronics. 1996 ; Vol. 11, No. 6-7. pp. 601-612.
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