The effect of diffraction gratings on absorption in P3HT: PCBM layers

B. Cocilovo, A. Amooali, S. Shahin, S. Islam, B. Au Thanh Duong, M. Campbell, Palash Gangopadhyay, J. Thomas, Robert A Norwood

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An integrating shere is used to measure the absorptance of P3HT:PCBM layers with 700 nm period gratings on the reverse side of the substrate. Gratings that do not exploit TIR adversely affect the absorptance.

Original languageEnglish (US)
Title of host publicationOptics InfoBase Conference Papers
Publication statusPublished - 2012
EventOptical Nanostructures and Advanced Materials for Photovoltaics, PV 2012 - Eindhoven, Netherlands
Duration: Nov 11 2012Nov 14 2012

Other

OtherOptical Nanostructures and Advanced Materials for Photovoltaics, PV 2012
CountryNetherlands
CityEindhoven
Period11/11/1211/14/12

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ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Cocilovo, B., Amooali, A., Shahin, S., Islam, S., Au Thanh Duong, B., Campbell, M., ... Norwood, R. A. (2012). The effect of diffraction gratings on absorption in P3HT: PCBM layers. In Optics InfoBase Conference Papers