The Polaris-M ray tracing program

Russell A Chipman, Wai Sze T Lam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

An optical design program, Polaris-M, developed at the University of Arizona incorporates many advanced polarization analysis features. At the core of the program is a three-dimensional polarization ray tracing structure used to characterize polarization effects occurring at interfaces and upon propagation through isotropic and anisotropic materials. Reflection and refraction at uniaxial, biaxial, and optically active interfaces are handled rigorously, as well as anisotropic grating structures. By analyzing multiple polarized wavefront components individually, one can study the complicated effects of multiple anisotropic optical elements at the image. Wavefronts can be expanded into polarization aberration terms. Polarized diffraction image formation and polarization dependent optical transfer functions are included.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume9613
ISBN (Print)9781628417791
DOIs
StatePublished - 2015
EventPolarization Science and Remote Sensing VII - San Diego, United States
Duration: Aug 11 2015Aug 12 2015

Other

OtherPolarization Science and Remote Sensing VII
CountryUnited States
CitySan Diego
Period8/11/158/12/15

Keywords

  • imaging
  • Polarization
  • polarization aberration
  • polarization ray tracing

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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  • Cite this

    Chipman, R. A., & Lam, W. S. T. (2015). The Polaris-M ray tracing program. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 9613). [96130J] SPIE. https://doi.org/10.1117/12.2188928