The Polaris-M ray tracing program

Russell A Chipman, Wai Sze T Lam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

An optical design program, Polaris-M, developed at the University of Arizona incorporates many advanced polarization analysis features. At the core of the program is a three-dimensional polarization ray tracing structure used to characterize polarization effects occurring at interfaces and upon propagation through isotropic and anisotropic materials. Reflection and refraction at uniaxial, biaxial, and optically active interfaces are handled rigorously, as well as anisotropic grating structures. By analyzing multiple polarized wavefront components individually, one can study the complicated effects of multiple anisotropic optical elements at the image. Wavefronts can be expanded into polarization aberration terms. Polarized diffraction image formation and polarization dependent optical transfer functions are included.

Original languageEnglish (US)
Title of host publicationPolarization Science and Remote Sensing VII
EditorsJoseph A. Shaw, Daniel A. LeMaster
PublisherSPIE
ISBN (Electronic)9781628417791
DOIs
StatePublished - 2015
EventPolarization Science and Remote Sensing VII - San Diego, United States
Duration: Aug 11 2015Aug 12 2015

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9613
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherPolarization Science and Remote Sensing VII
Country/TerritoryUnited States
CitySan Diego
Period8/11/158/12/15

Keywords

  • Polarization
  • imaging
  • polarization aberration
  • polarization ray tracing

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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