Thermal boundary resistance correlated with strain energy in individual Si film-wafer twist boundaries

D. Xu, R. Hanus, Y. Xiao, S. Wang, G. J. Snyder, Q. Hao

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Fingerprint

Dive into the research topics of 'Thermal boundary resistance correlated with strain energy in individual Si film-wafer twist boundaries'. Together they form a unique fingerprint.

Chemical Compounds

Physics & Astronomy

Engineering & Materials Science