Thermal properties and crystallization dynamics of a phase-change alloy for write-once optical data storage

Gerd M. Fischer, Brian Medower, Robert Revay, Masud Mansuripur

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Using a two-laser static tester, we measured the crystallization temperature and the thermal conductivity of a phase-change alloy thin film used in write-once-read-many media of optical data storage. The experimental technique, in general, and the calibration procedures, in particular, are described. The measurement results are used as entry points into numerical calculations that ultimately yield estimates of the material parameters. Valuable information about the dynamics of mark formation (i.e., localized crystallization) in amorphous phase-change alloy films is obtained from the observed variations of the sample reflectance under short-pulse and long-pulse recording conditions. The dependence of these reflectance variations on the laser pulse power has also been investigated.

Original languageEnglish (US)
Pages (from-to)1998-2007
Number of pages10
JournalApplied Optics
Volume41
Issue number10
StatePublished - Apr 1 2002

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Optical data storage
data storage
Thermodynamic properties
thermodynamic properties
Crystallization
crystallization
pulses
reflectance
Laser pulses
Thermal conductivity
Calibration
test equipment
entry
Thin films
lasers
Lasers
thermal conductivity
recording
estimates
thin films

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Thermal properties and crystallization dynamics of a phase-change alloy for write-once optical data storage. / Fischer, Gerd M.; Medower, Brian; Revay, Robert; Mansuripur, Masud.

In: Applied Optics, Vol. 41, No. 10, 01.04.2002, p. 1998-2007.

Research output: Contribution to journalArticle

Fischer, Gerd M. ; Medower, Brian ; Revay, Robert ; Mansuripur, Masud. / Thermal properties and crystallization dynamics of a phase-change alloy for write-once optical data storage. In: Applied Optics. 2002 ; Vol. 41, No. 10. pp. 1998-2007.
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